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2001

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Superconductor-metal-insulator transitions


Fluctuation effects in high sheet resistance superconducting films

 а,  а,  б,  а
а Brown University, Providence, Rhode Island, USA
б National Chiao Tung University, Ta Hsueh Road 300 Hsinchu 1001 Taiwan , Hsinchu, Тайвань

As the normal-state sheet resistance, $R_n$, of a thinfilm superconductor increases, its superconducting properties degrade. For $R_n\simeq h/4e^2$ superconductivity disappears and a transition to a nonsuperconducting state occurs. We present electron tunneling and transport measurements on ultrathin, homogeneously disordered superconducting films in the vicinity of this transition. The data provide strong evidence that fluctuations in the amplitude of the superconducting order parameter dominate the tunneling density of states and the resistive transitions in this regime. We briefly discuss possible sources of these amplitude fluctuation effects. We also describe how the data suggest a novel picture of the superconductor-tononsuperconductor transition in homogeneous $\mathrm{2D}$ systems.

Текст pdf (197 Кб)
English fulltext is available at DOI: 10.1070/1063-7869/44/10S/S23
PACS: 71.30.+h, 73.23.Hk, 74.50.+r, 74.76.-w (все)
DOI: 10.1070/1063-7869/44/10S/S23
URL: https://ufn.ru/ru/articles/2001/13/w/
Цитата: Valles J M, Chervenak J A, Hsu S.-Y., Kouh T "Fluctuation effects in high sheet resistance superconducting films" УФН 171 104–108 (2001)
BibTexBibNote ® (generic)BibNote ® (RIS) MedlineRefWorks
Русский English
PT Journal Article
TI Fluctuation effects in high sheet resistance superconducting films
AU Valles J M
FAU Valles JM
AU Chervenak J A
FAU Chervenak JA
AU Hsu S.-Y.
FAU Hsu S.-Y.
AU Kouh T
FAU Kouh T
DP 10 Sup, 2001
TA Усп. физ. наук
VI 171
IP 13
PG 104-108
RX 10.1070/1063-7869/44/10S/S23
URL https://ufn.ru/ru/articles/2001/13/w/
SO Усп. физ. наук 2001 Sup 10;171(13):104-108

English citation: Valles J M, Chervenak J A, Hsu S.-Y., Kouh T “Fluctuation effects in high sheet resistance superconducting filmsPhys. Usp. 44 104–108 (2001); DOI: 10.1070/1063-7869/44/10S/S23

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