Issues

 / 

2020

 / 

January

  

Reviews of topical problems


X-ray diffraction methods for structural diagnostics of materials: progress and achievements


Lomonosov Moscow State University, Department of Chemistry, Leninskie Gory 1, str. 3, Moscow, 119991, Russian Federation

Development of X-ray diffractometry at the turn of the 20th and 21st centuries is presented. The review covers instrumentation development for structural studies based on the usage of both standard continuously radiating X-ray generators and state-of-the-art sources of ultrashort and ultra-bright X-ray pulses. The latter technique enables investigation of the structural dynamics of condensed matter in a 4D space-time continuum with a resolution of up to a tenth of femtosecond. New engineering approaches to enhancing sensitivity, accuracy, and efficiency of X-ray diffraction experiments are discussed including new and promising X-rays sources, reflective collimating and focusing X-ray optics, fast low-noise and radiation-resistant position-sensitive X-ray detectors, as well as a new generation of X-ray diffractometers developed based on these elements. Presentation is focused on modern engineering solutions that enable academic and applied-research laboratories to perform on-site the X-ray diffraction studies that earlier were only feasible using synchrotron radiation sources at international resource sharing centers.

Typically, an English fulltext is available in about 3 months from the date of publication of the original article.

Keywords: X-ray diffraction, synchrotron radiation, X-ray diffractometers, pulse X-ray sources, laser-plasma X-ray sources, alternative X-ray sources, X-ray free-electron lasers, reflective X-ray optics, multilayer thin-film X-ray reflectors, semiconductor position-sensitive X-ray detectors, two-dimensional hybrid pixel detectors
PACS: 07.85.−m, 42.55.Vc, 61.05.C− (all)
DOI: 10.3367/UFNe.2018.10.038435
URL: https://ufn.ru/en/articles/2020/1/b/
Citation: Fetisov G V "X-ray diffraction methods for structural diagnostics of materials: progress and achievements" Phys. Usp. 63 (1) (2020)

Received: 10th, August 2018, revised: 15th, September 2018, 4th, October 2018

Оригинал: Фетисов Г В «Рентгеновские дифракционные методы структурной диагностики материалов: прогресс и достижения» УФН 190 2–36 (2020); DOI: 10.3367/UFNr.2018.10.038435

References (266) ↓ Cited by (1) Similar articles (20)

  1. Chung F H, Smith D K (Eds) Industrial Application Of X-Ray Diffraction (New York: Marcel Dekker, 2000)
  2. Mittemeijer E J, Scardi P (Eds) Diffraction Analysis Of The Microstructure Of Materials (Berlin: Springer, 2004)
  3. Dinnebier R E, Billinge S J L (Eds) Powder Diffraction: Theory And Practice (Cambridge: Royal Society of Chemistry, 2008)
  4. Mittemeijer E J, Welzel U (Eds) Modern Diffraction Methods (New York: Wiley-VCH Verlag, 2013)
  5. Kumar C S S R (Eds) X-Ray And Neutron Techniques For Nanomaterials Characterization (New York: Springer, 2016)
  6. Friedrich W, Knipping P, von Laue M Sitzungsberichte Kgl. Bayer. Akad. Wiss. 303 (1912); reprinted, Friedrich W, Knipping P, von Laue M Naturawissenschaften 39 361 (1952)
  7. von Laue M Sitzungsberichte Kgl. Bayer. Akad. Wiss. 363 (1912)
  8. Bragg W H, Bragg W L Proc. R. Soc. London A 88 428 (1913)
  9. Bragg W H Phil. Trans. R. Soc. 215 253 (1915)
  10. Wulf G Phys. Z. 14 217 (2013); Per. na russk. yaz., Vul’f Yu V Izbrannye Trudy Po Kristallofizike i Kristallografii (M. - L.: GITTL, 1952) p. 326
  11. Guinier A Theorie Et Technique De La Radiocristallographie 2nd ed. (Paris: Dunod, 1956); Per. na russk. yaz., Gin’e A Rentgenografiya Kristallov. Teoriya i Praktika (M.: GIFML, 1961)
  12. Warren B E X-Ray Diffraction (Reading, Mass.: Addison-Wesley Publ. Co., 1969)
  13. Klug H P, Alexander L E X-Ray Diffraction Procedures For Polycrystalline And Amorphous Materials 2nd Ed. (New York: John Wiley, 1974)
  14. Arndt U W, Wonacott A J The Rotation Method In Crystallography (Amsterdam: North-Holland Publ. Co., 1977)
  15. Porai-Koshits M A Osnovy Strukturnogo Analiza Khimicheskikh Soedinenii (M.: Vysshaya shkola, 1989)
  16. Blake A J et al Crystal Structure Analysis: Principles And Practice (Ed. W Clegg) 2nd ed. (New York: Oxford Univ. Press, 2009)
  17. Pecharsky V K, Zavalij P Y Fundamental Of Powder Diffraction And Structural Characterization Of Materials 2nd ed. (Berlin: Springer, 2009)
  18. Egami T, Billinge S J L Underneath The Bragg Peaks: Structural Analysis Of Complex Materials 2nd ed. (Amsterdam: Elsevier, 2012)
  19. Sattler K D (Ed.) Handbook Of Nanophysics: Principles And Methods (Boca Raton, Fl.: Taylor and Francis Group, CRC Press, 2011)
  20. Ischenko A A, Fetisov G V, Aslanov L A Nanosilicon: Properties, Synthesis, Applications, Methods Of Analysis And Control (Boca Raton, Fl.: CRC Press, 2015)
  21. Michaelsen C et al Adv. X-Ray Anal. 42 308 (2000)
  22. Kumakhov M A Proc. SPIE 4155 2 (2000)
  23. Bilderback D H X-Ray Spectrom. 32 195 (2003)
  24. Hertlein F et al Part. Part. Syst. Charact. 22 378 (2006)
  25. Shimizu K, Omote K Rigaku J. 24 1 (2008)
  26. Wohlschlögel M et al J. Appl. Cryst. 41 124 (2008)
  27. Mundboth K et al J. Synchrotron Rad. 21 16 (2014)
  28. Sandukovskii V G, Savel’ev V I Fiz. Elem. Chast. At. Yad. 22 1347 (1991)
  29. Chilingarov A G Fiz. Elem. Chast. At. Yad. 23 785 (1992)
  30. User Manual PILATUS Detector Systems. Version 1.2, Dectris Ltd. 06.02.2009
  31. Skarzynski T Acta Cryst. D 69 1283 (2013)
  32. Dauter Z, Jaskolski M, Wlodawer A J. Synchrotron Rad. 17 433 (2010)
  33. Duke E M H, Johnson L N Proc. R. Soc. Lond. A 466 3421 (2010)
  34. Fetisov G V Sinkhrotronnoe Izluchenie. Metody Issledovaniya Struktury Veshchestv (M.: Fizmatlit, 2007)
  35. Zakharova E V Usp. Fiz. Nauk 177 803 (2007); Zakharova E V Phys. Usp. 50 767 (2007), sm. informatsiyu o knige [34]
  36. Bolotina N B Crystallogr. Rev. 15 143 (2009)
  37. Clarck S M Crystallogr. Rev. 8 57 (2002)
  38. Dong Y-H et al J. Appl. Cryst. 36 1123 (2003)
  39. Buras B et al International Tables For Crystallography (Ed. E Prince) 3rd ed. (Dordrecht: D. Reidel Publ. Co., 2004) p. 84
  40. Kümpfe B, Luczak F, Michel B Part. Part. Syst. Charact. 22 391 (2005)
  41. Leng Y Materials Characterization: Introduction To Microscopic And Spectroscopic Methods (Singapore: John Wiley and Sons, 2008)
  42. Porai-Koshits M A Prakticheskii Kurs Rentgenostrukturnogo Analiza Vol. 2 (M.: Izd-vo MGU, 1960)
  43. Glatter O, Kratky O (Eds) Small Angle X-Ray Scattering (New York: Academic Press, 1982)
  44. Svergun D I, Feigin L A Rentgenovskoe i Neitronnoe Malouglovoe Rasseyanie (M.: Nauka, 1986); Per. na angl. yaz., FeigL A, Svergun D I Structure Analysis By Small-Angle X-Ray And Neutron Scattering (New York: Plenum Press, 1987)
  45. Helliwell J R Macromolecular Crystallography With Synchrotron Radiation (Cambridge: Cambridge Univ. Press, 1992)
  46. Young R A (Ed.) The Rietveld Method (Oxford: Oxford Univ. Press, 1995)
  47. Ren Z et al J. Synchrotron Rad. 6 891 (1999)
  48. Will G Powder Diffraction: The Rietveld Method And The Two Stage Method To Determine And Refine Crystal Structures From Powder Diffraction Data (Berlin: Springer, 2006)
  49. Aslanov L A, Fetisov G V, Howard J A K Crystallographic Instrumentation (Oxford: Oxford Univ. Press, 1998)
  50. Chernyshev V V Izv. RAN Ser. Khim. (12) 2174 (2001); Chernyshev V V Russ. Chem. Bull. 50 2273 (2001)
  51. Ladd M, Palmer R Structure Determination By X-Ray Crystallography. Analysis By X-Rays And Neutrons 5th ed. (New York: Springer, 2013)
  52. Fawcett T et al Powder Diffr. 32 63 (2017)
  53. Billinge S J L, Thorpe M F (Eds) Local Structure From Diffraction (New York: Kluwer Acad. Publ., 2002)
  54. Pyt’ev Yu P, Shishmarev I A Kurs Teorii Veroyatnostei i Matematicheskoi Statistiki dlya Fizikov (M.: Izd-vo MGU, 1983)
  55. Borek D, Minor W, Otwinowski Z Acta Cryst. D 59 2031 (2003)
  56. Wilson A J C International Tables For Crystallography Vol. C 1st online ed. (Dordrecht: D. Reidel Publ. Co., 2006) p. 666
  57. Fetisov G V Analiticheskaya Khimiya i Fiziko-khimicheskie Metody Analiza Vol. 2 2-e izd. (Pod red. A A Ishchenko) (M.: Akademiya, 2012) p. 153
  58. Coolidge W D Phys. Rev. 2 409 (1913)
  59. Coolidge W D, Dempster L E, Tanis H E (Jr.) Physics 1 230 (1931)
  60. Als-Nielsen J, McMorrow D Elements Of Modern X-Ray Physics Vol. 2nd ed. (New York: John Wiley and Sons, 2011)
  61. Ternov I M Usp. Fiz. Nauk 165 429 (1995); Ternov I M Phys. Usp. 38 409 (1995)
  62. Potylitsyn A P, Vnukov I E Electron—Photon Interaction In Dense Media (Ed. H Wiedemann) (Berlin: Springer, 2002) p. 25
  63. Baryshevsky V G, Feranchuk I D, Ulyanenkov A P Parametric X-Ray Radiation In Crystals: Theory, Experiment And Applications (Berlin: Springer, 2005)
  64. Miaja-Avila L et al Struct. Dyn. 2 024301 (2015)
  65. Brenner C M et al Plasma Phys. Control. Fusion 58 014039 (2016)
  66. Mills D M et al J. Synchrotron Rad. 12 385 (2005)
  67. Attwood D, Sakdinawat A X-Rays And Extreme Ultraviolet Radiation: Principles And Applications (Cambridge: Cambridge Univ. Press, 2017)
  68. Mobilio S, Boscherini F, Meneghini C (Eds) Synchrotron Radiation. Basics, Methods And Applications (Berlin: Springer, 2015)
  69. Guinebretière R X-Ray Diffraction By Polycrystalline Materials (New York: Wiley, 2007)
  70. Wiedemann H Synchrotron Radiation (Berlin: Springer, 2003)
  71. Jaeschke E et al (Eds) Synchrotron Light Sources And Free-Electron Lasers. Accelerator Physics, Instrumentation And Science Applications (Berlin: Springer, 2016)
  72. Thompson A C et al X-Ray Data Booklet (LBNL/PUB-490 Rev. 3) 3rd ed. (Berkeley, Calif.: Lawrence Berkeley National Laboratory Univ. of California, 2009); Thompson A C et al http://xdb.lbl.gov/xdb-new.pdf
  73. Robinson A X-Ray Data Booklet (LBNL/PUB-490 Rev. 3, Ed. A C Thompson) 3rd ed. (Berkeley, Calif.: Lawrence Berkeley National Laboratory Univ. of California, 2009) p. 2-21
  74. Lightsources.org Collab. Light sources of the world, https://lightsources.org/lightsources-of-the-world/
  75. Siffalovic P et al X-Ray And Neutron Techniques For Nanomaterials Characterization (Ed. C S S R Kumar) (Berlin: Springer-Verlag, 2016) p. 507
  76. Hemberg O, Otendal M, Hertz H M Appl. Phys. Lett. 83 1483 (2003)
  77. Geloni G, Huang Z, Pellegrini C X-Ray Free Electron Lasers: Applications In Materials, Chemistry And Biology (Energy and Environment Series) Vol. 18 (Eds U Bergmann, V K Yachandra, J Yano) (London: The Royal Society of Chemistry, 2017) p. 3
  78. Leoni M, Welzel U, Scardi P J. Res. Natl. Inst. Standards Technol. 109 27 (2004)
  79. Leoni M Ischenko A A, Fetisov G V, Aslanov L A. Nanosilicon. Properties, Synthesis, Applications, Methods Of Analysis And Control (Boca Raton, FL: CRC Press, 2015) p. 519
  80. James R W The Optical Principles Of The Diffraction Of X-Rays (London: G. Bell and Sons, 1948); Per. na russk. yaz., Dzheims R Opticheskie Printsipy Difraktsii Rentgenovskikh Luchei (M.: IL, 1950)
  81. Coppens P et al Synchrotron Radiation Crystallography (London: Academic Press, 1992)
  82. Kulipanov G N Usp. Fiz. Nauk 177 384 (2007); Kulipanov G N Phys. Usp. 50 368 (2007)
  83. Margaritondo G Synchrotron Radiation. Basics, Methods And Applications (Eds S Mobilio, F Boscherini, C Meneghini) (Berlin: Springer, 2015) p. 29
  84. Wiedemann H Particle Accelerator Physics (Berlin: Springer-Verlag, 2007)
  85. Pellegrini C, Stöhr J Nucl. Instrum. Meth. Phys. Res. A 500 33 (2003)
  86. Kurilko V I, Tkach Yu V Usp. Fiz. Nauk 165 241 (1995); Kurilko V I, Tkach Yu V Phys. Usp. 38 231 (1995)
  87. Huang Z, Kim K-J Phys. Rev. ST Accel. Beams 10 034801 (2007)
  88. Emma P et al Nature Photon. 4 641 (2010)
  89. Yabashi M, Tanaka H, Ishikawa T J. Synchrotron Rad. 22 477 (2015)
  90. Kim K-J et al Proc. of the Intern. Particle Accelerator Conf. IPAC’16, Busan, Korea, May 8-13, 2016 p. 801, paper MOPOW039
  91. Madsen A, Sinn H CERN Courier 57 (6) 19 (2017)
  92. Kim K-J, Shvyd’ko Yu, Reiche S Phys. Rev. Lett. 100 244802 (2008)
  93. Kim K-J, Shvyd’ko Yu V Phys. Rev. ST Accel. Beams 12 030703 (2009)
  94. Li K, Deng H Nucl. Instrum. Meth. Phys. Res. A 895 40 (2018)
  95. Chergui M, Collet E Chem. Rev. 117 11025 (2017)
  96. The European XFEL in International Comparison, https://www.xfel.eu/facility/comparison/index_eng.html
  97. Schmüser P et al Free-Electron Lasers In The Ultraviolet And X-Ray Regime (Berlin: Springer, 2014)
  98. Huang Z, Ingolf L Nature Photon. 6 505 (2012)
  99. Ishikawa T et al Nature Photon. 6 540 (2012)
  100. The European XFEL Overview, https://www.xfel.eu/facility/overview/index_eng.html
  101. Von der Linde D et al Laser Part. Beams 19 15 (2001)
  102. Jaroszynski D A et al Phil. Trans. R. Soc. Lond. A 364 689 (2006)
  103. Gauthier J-C Progress In Ultrafast Intense Laser Science Vol. 1 (Berlin: Springer, 2006) p. 151
  104. Tsipenyuk Yu M Fundamental’nye i Prikladnye Issledovaniya na Mikrotrone (M.: Fizmatlit, 2009)
  105. CORDIS: Final Report — LABSYNC, Laboratory compact light sources. Project ID: 213126. Belgium, 2012, http://cordis.europa.eu/result/rcn/54953_en.html
  106. Yamada H et al Comprehensive Biomedical Physics Vol. 8 (Ed. A Brahme) (Amsterdam: Elsevier, 2014) p. 43
  107. Lobko A S Eksperimental’nye Issledovaniya Parametricheskogo Rentgenovskogo Izlucheniya (Minsk: BGU, 2006)
  108. Minkov D A, Yamada H Annu. J. Electron. 166 (2014)
  109. Yamada H et al Proc. SPIE 7078 70780P (2008)
  110. Yamada H J. Synchrotron Rad. 5 1326 (1998)
  111. Yamada H AIP Conf. Proc. 716 12 (2004)
  112. Polyakov S N et al Proc. SPIE 10243 102430Y (2017)
  113. Eggl E et al J. Synchrotron Rad. 23 1137 (2016)
  114. Artyukov I A et al Laser Part. Beams 34 637 (2016)
  115. Artyukov I A et al J. Phys. Conf. Ser. 784 012002 (2017)
  116. Pfeifer T, Spielmann C, Gerber G Rep. Prog. Phys. 69 443 (2006)
  117. Macchi A A Superintense Laser-Plasma Interaction Theory Primer (Berlin: Springer, 2013)
  118. Walker P A et al J. Phys. Conf. Ser. 874 012029 (2017)
  119. Jaroszynski D A, Vieux G AIP Conf. Proc. 647 902 (2002)
  120. Leemans W P et al Nature Phys. 2 696 (2006)
  121. Leemans W, Esarey E Phys. Today 62 (3) 44 (2009)
  122. Leemans W P et al Particle Accelerator Conf., PAC’11 p. 1416, paper WEOBS1
  123. Leemans W P et al Phys. Rev. Lett. 113 245002 (2014)
  124. Esarey E, Schroeder C B, Leemans W P Rev. Mod. Phys. 81 1229 (2009)
  125. Corde S et al Rev. Mod. Phys. 85 1 (2013)
  126. Malka V Laser-Plasma Interactions And Applications (Eds P McKenna et al) (Berlin: Springer, 2013) p. 281
  127. Wang X et al Nature Commun. 4 1988 (2013)
  128. Rini M Physics 7 126 (2014)
  129. Kostyukov I Yu, Pukhov A M Usp. Fiz. Nauk 185 89 (2015); Kostyukov I Yu, Pukhov A M Phys. Usp. 58 81 (2015)
  130. Maier A R, Kirchen M, Grüner F Synchrotron Light Sources And Free-Electron Lasers (Eds E Jaeschke et al) (Cham: Springer, 2016) p. 225
  131. Giulietti D, Gizzi L A Riv. Nuovo Cimento 21 1 (1998)
  132. Artsimovich L A, Sagdeev R Z Fizika Plazmy dlya Fizikov (M.: Atomizdat, 1979)
  133. Rousse A et al Phys. Rev. E 50 2200 (1994)
  134. Jiang Z et al Phys. Plasmas 2 1702 (1995)
  135. Schwoerer H Femtosecond Technology For Technical And Medical Applications (Eds F Dausinger, F Lichtner, H Lubatschowski) (Berlin: Springer-Verlag, 2004) p. 235
  136. Gibbon P Short Pulse Laser Interactions With Matter: An Introduction (London: Imperial College Press, 2005)
  137. Tsukerman V A, Tarasova L V, Lobov S I Usp. Fiz. Nauk 103 319 (1971); Tsukerman V A, Tarasova L V, Lobov S I Sov. Phys. Usp. 14 61 (1971)
  138. Mead S W et al Appl. Opt. 11 345 (1972)
  139. Mallozzi P J et al J. Appl. Phys. 45 1891 (1974)
  140. Rumsby P T J. Microsc. 138 245 (1985)
  141. Vinogradov A V, Shlyaptsev V N Kvantovaya Elektronika 14 5 (1987); Vinogradov A V, Shlyaptsev V N Sov. J. Quantum Electron. 17 1 (1987)
  142. Gamalii E G, Rozanov V B Fizicheskaya Entsiklopediya Vol. 2 (Gl. red. A M Prokhorov, 1990) p. 552
  143. Andreev A A, Yashin V E, Charukhchev A V Usp. Fiz. Nauk 169 72 (1999); Andreev A A, Yashin V E, Charukhchev A V Phys. Usp. 42 66 (1999)
  144. Wharton K B et al Phys. Rev. E 64 025401(R) (2001)
  145. Ishchenko A A i dr Usp. Fiz. Nauk 184 681 (2014); Ishchenko A A et al Phys. Usp. 57 633 (2014)
  146. Ischenko A A, Weber P M, Miller R J D Uspekhi Khimii 86 1173 (2017); Ischenko A A, Weber P M, Miller R J D Russ. Chem. Rev. 86 1173 (2017)
  147. Ishchenko A A Struktura i Dinamika Svobodnykh Molekul i Kondensirovannogo Veshchestva (M.: Fizmatlit, 2018)
  148. Ditmire T et al Radiat. Phys. Chem. 70 535 (2004)
  149. Compant La Fontaine A, Courtois C, Lefebvre E Phys. Plasmas 19 023104 (2012)
  150. Mulser P, Sigel R, Witkowski S Phys. Rep. 6 187 (1973)
  151. Gordienko V M, Savel’ev A B Usp. Fiz. Nauk 169 78 (1999); Gordienko V M, Savel’ev A B Phys. Usp. 42 72 (1999)
  152. Jiang Y, Lee T, Rose-Petruck C G J. Opt. Soc. Am. B 20 229 (2003)
  153. Ledingham K W D et al arXiv:1106.4152
  154. Mourou G A, Tajima T, Bulanov S V Rev. Mod. Phys. 78 309 (2006)
  155. Perry M D, Mourou G Science 264 917 (1994)
  156. Umstadter D J. Phys. D 36 R151 (2003)
  157. Joshi C J, Corkum P B Phys. Today 48 (1) 36 (1995)
  158. Popmintchev T et al Science 336 1287 (2012)
  159. Gibbon P CERN Yellow Report CERN-2016-001 (Geneva: CERN, 2016); Gibbon P arXiv:1705.10529
  160. Elsaesser T, Woerner M Acta Cryst. A 66 168 (2010)
  161. Zamponi F et al Appl. Phys. A 96 51 (2009)
  162. Fullagar W et al Rev. Sci. Instrum. 78 115105 (2007)
  163. Bargheer M et al Appl. Phys. B 80 715 (2005)
  164. Edwards R D et al Appl. Phys. Lett. 80 2129 (2002)
  165. Andreev A A et al Phys. Rev. E 65 026403 (2002)
  166. Salzmann D et al Phys. Rev. E 65 036402 (2002)
  167. Andreev A A, Platonov K Yu Kvantovaya Elektronika 41 515 (2011); Andreev A A, Platonov K Yu Quantum Electron. 41 515 (2011)
  168. Tajima T, Dawson J M Phys. Rev. Lett. 43 267 (1979)
  169. Esarey E et al IEEE Trans. Plasma Sci. 24 252 (1996)
  170. Hooker S M Nature Photon. 7 775 (2013)
  171. Stephan F, Krasilnikov M Synchrotron Light Sources And Free-Electron Lasers: Accelerator Physics, Instrumentation And Science Applications (Eds E J Jaeschke, S Khan, J R Schneider) (New York: Springer, 2016) p. 561
  172. Fuchs M et al Nature Phys. 5 826 (2009)
  173. Korn G Physics 7 125 (2014)
  174. Loulergue A et al New J. Phys. 17 023028 (2015)
  175. Jenkins R, Snyder R L Introduction To X-Ray Powder Diffractometry (New York: Wiley, 1996)
  176. Mathieu M, Steier V Xenocs News Lett. 8 1 (2008)
  177. Schulz T et al J. Appl. Cryst. 42 885 (2009)
  178. MacDonald C A X-Ray Opt. Instrum. 2010 867049 (2010)
  179. MacDonald C A, Owens S M, Gibson W M J. Appl. Cryst. 32 160 (1999)
  180. Kumakhov M A Proc. SPIE 5943 59430B (2006)
  181. Kumakhov M A Proc. SPIE 4765 20 (2002)
  182. Gibson D, Gibson W Adv. X-Ray Anal. 45 286 (2002)
  183. Cornaby S et al Adv. X-Ray Anal. 50 194 (2006)
  184. Bjeoumikhov A, Bjeoumikhova S, Wedell R Part. Part. Syst. Charact. 22 384 (2005)
  185. Bolotokov A i dr Analitika (4) 14 (2012)
  186. Arndt U W J. Appl. Cryst. 23 161 (1990)
  187. Bjeoumikhov A et al X-Ray Spectrom. 34 493 (2005)
  188. Schields P J et al Powder Diffraction 17 (2) 70 (2002)
  189. Hart M, Berman L Acta Cryst. A 54 850 (1998)
  190. Schuster M et al Proc. SPIE 3767 183 (1999)
  191. Schuster S M, Göbel H Adv. X-Ray Anal. 39 57 (1997)
  192. Yang C, Courville A, Ferrara J D Acta Cryst. D 55 1681 (1999)
  193. Wiesmann J et al Acta Cryst. A 66 s291 (2010)
  194. Omote K, Harada J Adv. X-Ray Anal. 43 192 (2000)
  195. Bergmann A et al J. Appl. Cryst. 33 869 (2000)
  196. Vetterling W T, Pound R V J. Opt. Soc. Am. 66 1048 (1976)
  197. Kumakhov M A Nucl. Instrum. Meth. Phys. Res. B 48 283 (1990)
  198. Gubarev M et al J. Appl. Cryst. 33 882 (2000)
  199. Engström P et al Nucl. Instrum. Meth. Phys. Res. B 36 222 (1989)
  200. Huang R, Bilderback D H J. Synchrotron Rad. 13 74 (2006)
  201. Gillilan R E et al J. Synchrotron Rad. 17 227 (2010)
  202. Arkad’ev V A, Kumakhov M A, Fayazov R F Pis’ma ZhTF 14 226 (1988); Arkad’ev V A, Kumakhov M A, Fayazov R F Sov. Tech. Phys. Lett. 14 101 (1988)
  203. Bushuev V A, Orudzhaliev M N, Kuz’min R N Bectn. MGU. Cep. 3, Fizika. Astronomiya 31 (1) 76 (1990)
  204. Bjeoumikhov A et al X-Ray Spectrom. 33 312 (2004)
  205. Engström P et al Nucl. Instrum. Meth. Phys. Res. A 302 547 (1991)
  206. Riekel C et al Macromolecules 30 1033 (1997)
  207. Oosterkamp W J, Philips L Res. Rep. 3 303 (1948)
  208. Pankratov E L, Chkhalo N I Teplofiz. Vys. Temp. 44 770 (2006); Pankratov E L, Chkhalo N I High Temp. 44 766 (2006)
  209. Lundström U MetalJet X-Ray Sources for High Intensity X-Ray Beams. NIS Colloquium, X-Ray Induced Modifications in Materials: Applications and Challenges (Torino: Univ. di Torino, 2017); Lundström U http://www.solid.unito.it/XIMM/EXCILLUM.pdf
  210. Wiesmann J et al Part. Part. Syst. Charact. 26 112 (2009)
  211. Rackwitz V J. Anal. Atom. Spectrom. 26 499 (2011)
  212. Rackwitz V, Warrikhoff A, Hodoroab V-D J. Anal. Atom. Spectrom. 29 458 (2014)
  213. Hemberg O E, Otendal M, Hertz H M Opt. Eng. 43 1682 (2004)
  214. Larsson D et al Rev. Sci. Instrum. 82 123701 (2011)
  215. Espes E et al Proc. SPIE 9212 92120J (2014)
  216. Graf J et al Acta Cryst. A 73 C1249 (2017)
  217. Arndt U W, Gilmore D J J. Appl. Cryst. 12 1 (1979)
  218. Aslanov L A Instrumental’nye Metody Rentgenostrukturnogo Analiza (M.: Izd-vo MGU, 1983)
  219. He B B Two-Dimensional X-Ray Diffraction 2nd ed. (Hoboken, NJ: Wiley, 2018)
  220. Namatane Y et al Rigaku J. 34 (1) 9 (2018)
  221. Hinrichsen B, Dinnebier R E, Jansen M Powder Diffraction: Theory And Practice (Eds R E Dinnebier, S J L Billinge) (Cambridge: Royal Society of Chemistry) 14 (2008)
  222. Ponchut C J. Synchrotron Rad. 13 195 (2006)
  223. Madden T et al J. Phys. Conf. Ser. 493 012016 (2014)
  224. Ohbuchi A Rigaku J. 31 (1) 4 (2015)
  225. Basolo S et al J. Synchrotron Rad. 14 151 (2007)
  226. Chupas P J et al J. Appl. Cryst. 36 1342 (2003)
  227. Billinge S J L Z. Kristallogr. Suppl. 26 17 (2007)
  228. Toby B H et al J. Appl. Cryst. 46 1058 (2013)
  229. Gelisio L, Scardi P Acta Cryst. A 72 608 (2016)
  230. Gruner S M, Tate M W, Eikenberry E F Rev. Sci. Instrum. 73 2815 (2002)
  231. Klein C marXperts GmbH, Application Note (2014)
  232. Amemiya Y et al Nucl. Instrum. Meth. Phys. Res. A 266 645 (1988)
  233. Dauter Z, Wilson K S Acta Phys. Polon. A 86 477 (1994)
  234. He T et al Proc. SPIE 8142 81421Q (2011)
  235. Product Sheet SC-XRD 31, Order No. DOC-S86-EXS031 V2. Bruker AXS Inc. (2011)
  236. Brönnimann C, Trüb P Synchrotron Light Sources And Free-Electron Lasers (Eds E Jaeschke, S Khan, J R Schneider) (New York: Springer, 2016) p. 995
  237. Schmitt B et al Nucl. Instrum. Meth. Phys. Res. A 518 436 (2004)
  238. Hülsen G et al AIP Conf. Proc. 705 1009 (2004)
  239. Philips Analytical X’Celerator J. Appl. Cryst. 34 538 (2001)
  240. Dauter Z Acta Cryst. D 55 1703 (1999)
  241. Pflugrath J W Acta Cryst. D 55 1718 (1999)
  242. Mueller M, Wang M, Schulze-Briese C Acta Cryst. D 68 42 (2012)
  243. STOE X-area software manual. STOE and Cie GmbH. September 21 (2011)
  244. Wenger E et al Acta Cryst. B 70 783 (2014)
  245. Webb J E Patent US 3415992 A. Published 10.12.1968, Filed 28.12.1965
  246. Pennicard D et al MRS Bull. 42 445 (2017)
  247. Lowe B G, Sareen R A Semiconductor X-Ray Detectors (Boca Raton, Fl.: CRC Press, 2014)
  248. Awadalla S, Iniewski K (Eds) Solid-State Radiation Detectors: Technology And Applications (Boca Baton, Fl.: CRC Press, 2015)
  249. Boudet N et al Nucl. Instrum. Meth. Phys. Res. A 510 41 (2003)
  250. Dinapoli R et al Nucl. Instrum. Meth. Phys. Res. A 650 79 (2011)
  251. Hamstra R H, Wendland P Appl. Opt. 11 1539 (1972)
  252. Jach T Nucl. Instrum. Meth. Phys. Res. A 299 76 (1990)
  253. Kirkland J P et al Nucl. Instrum. Meth. Phys. Res. A 266 602 (1988)
  254. Broennimann Ch et al J. Synchrotron Rad. 13 120 (2006)
  255. Henrich B et al Nucl. Instrum. Meth. Phys. Res. A 607 247 (2009)
  256. Donath T et al J. Phys. Conf. Ser. 425 062001 (2013)
  257. Hatsui T, Graafsma H IUCrJ 2 371 (2015)
  258. Ramírez-Jiménez F J AIP Conf. Proc. 857 121 (2006)
  259. Kriegner D et al J. Appl. Cryst. 48 613 (2015)
  260. Gerndt E et al Nucl. Instrum. Meth. Phys. Res. A 624 350 (2010)
  261. Gao M et al J. Appl. Cryst. 49 1182 (2016)
  262. "XtaLAB P200" Rigaku J. 29 (2) 26 (2013)
  263. Shiramata Y Rigaku J. 32 (1) 3 (2016)
  264. "High-resolution/high-speed 2D photon counting X-ray detector HyPix-300" Rigaku J. 30 (2) 38 (2014)
  265. Michaelsen C et al Adv. X-Ray Anal. 42 308 (2000)
  266. Hasse B et al Proc. SPIE 10387 103870B (2017)

© 1918–2020 Uspekhi Fizicheskikh Nauk
Email: ufn@ufn.ru Editorial office contacts About the journal Terms and conditions