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Reviews of topical problems


X-ray diffraction methods for structural diagnostics of materials: progress and achievements


Lomonosov Moscow State University, Department of Chemistry, Leninskie Gory 1, str. 3, Moscow, 119991, Russian Federation

Development of X-ray diffractometry at the turn of the 20th and 21st centuries is presented. The review covers instrumentation development for structural studies based on the usage of both standard continuously radiating X-ray generators and state-of-the-art sources of ultrashort and ultra-bright X-ray pulses. The latter technique enables investigation of the structural dynamics of condensed matter in a 4D space-time continuum with a resolution of up to a tenth of femtosecond. New engineering approaches to enhancing sensitivity, accuracy, and efficiency of X-ray diffraction experiments are discussed including new and promising X-rays sources, reflective collimating and focusing X-ray optics, fast low-noise and radiation-resistant position-sensitive X-ray detectors, as well as a new generation of X-ray diffractometers developed based on these elements. Presentation is focused on modern engineering solutions that enable academic and applied-research laboratories to perform on-site the X-ray diffraction studies that earlier were only feasible using synchrotron radiation sources at international resource sharing centers.

Fulltext pdf (1.2 MB)
Fulltext is also available at DOI: 10.3367/UFNe.2018.10.038435
Keywords: X-ray diffraction, synchrotron radiation, X-ray diffractometers, pulse X-ray sources, laser-plasma X-ray sources, alternative X-ray sources, X-ray free-electron lasers, reflective X-ray optics, multilayer thin-film X-ray reflectors, semiconductor position-sensitive X-ray detectors, two-dimensional hybrid pixel detectors
PACS: 07.85.−m, 42.55.Vc, 61.05.C− (all)
DOI: 10.3367/UFNe.2018.10.038435
URL: https://ufn.ru/en/articles/2020/1/b/
000537855600002
2-s2.0-85085127893
2020PhyU...63....2F
Citation: Fetisov G V "X-ray diffraction methods for structural diagnostics of materials: progress and achievements" Phys. Usp. 63 2–32 (2020)
BibTexBibNote ® (generic)BibNote ® (RIS)MedlineRefWorks

Received: 10th, August 2018, revised: 15th, September 2018, 4th, October 2018

Оригинал: Фетисов Г В «Рентгеновские дифракционные методы структурной диагностики материалов: прогресс и достижения» УФН 190 2–36 (2020); DOI: 10.3367/UFNr.2018.10.038435

References (266) ↓ Cited by (45) Similar articles (20)

  1. Chung F H, Smith D K (Eds) Industrial Application Of X-Ray Diffraction (New York: Marcel Dekker, 2000)
  2. Mittemeijer E J, Scardi P (Eds) Diffraction Analysis Of The Microstructure Of Materials (Berlin: Springer, 2004)
  3. Dinnebier R E, Billinge S J L (Eds) Powder Diffraction: Theory And Practice (Cambridge: Royal Society of Chemistry, 2008)
  4. Mittemeijer E J, Welzel U (Eds) Modern Diffraction Methods (New York: Wiley-VCH Verlag, 2013)
  5. Kumar C S S R (Eds) X-Ray And Neutron Techniques For Nanomaterials Characterization (New York: Springer, 2016)
  6. Friedrich W, Knipping P, von Laue M Sitzungsberichte Kgl. Bayer. Akad. Wiss. 303 (1912); reprinted, Friedrich W, Knipping P, von Laue M Naturawissenschaften 39 361 (1952)
  7. von Laue M Sitzungsberichte Kgl. Bayer. Akad. Wiss. 363 (1912)
  8. Bragg W H, Bragg W L Proc. R. Soc. London A 88 428 (1913)
  9. Bragg W H Phil. Trans. R. Soc. 215 253 (1915)
  10. Wulf G Phys. Z. 14 217 (2013); ’z’?р. ’?’? русс’?. ya’?., ’Eу’?ьф Yu ’E ’R’?’?р’?’?’?ы’? тру’?ы ’?’? ’?р’?ст’?’?’?’?ф’?’?’?’?’? ’? ’?р’?ст’?’?’?’?’?р’?ф’?’? (’a. - ’’.: ’I’R’n’n’’, 1952) с. 326
  11. Guinier A Theorie Et Technique De La Radiocristallographie 2nd ed. (Paris: Dunod, 1956); ’z’?р. ’?’? русс’?. ya’?., ’I’?’?ь’? ’B ’i’?’?т’?’?’?’?’?р’?ф’?ya ’?р’?ст’?’?’?’?’?. ’n’?’?р’?ya ’? ’?р’?’?т’?’?’? (’a.: ’I’R’s’a’’, 1961)
  12. Warren B E X-Ray Diffraction (Reading, Mass.: Addison-Wesley Publ. Co., 1969)
  13. Klug H P, Alexander L E X-Ray Diffraction Procedures For Polycrystalline And Amorphous Materials 2nd Ed. (New York: John Wiley, 1974)
  14. Arndt U W, Wonacott A J The Rotation Method In Crystallography (Amsterdam: North-Holland Publ. Co., 1977)
  15. ’z’?р’?’?-’F’?sh’?ts ’a ’B ’dс’?’?’?ы стру’?тур’?’?’?’? ’?’?’?’?’?’?’? kh’?’?’?ch’?с’?’?kh с’?’?’?’?’?’?’?’?’? (’a.: ’Eысsh’?ya sh’?’?’?’?, 1989)
  16. Blake A J et al Crystal Structure Analysis: Principles And Practice (Ed. W Clegg) 2nd ed. (New York: Oxford Univ. Press, 2009)
  17. Pecharsky V K, Zavalij P Y Fundamental Of Powder Diffraction And Structural Characterization Of Materials 2nd ed. (Berlin: Springer, 2009)
  18. Egami T, Billinge S J L Underneath The Bragg Peaks: Structural Analysis Of Complex Materials 2nd ed. (Amsterdam: Elsevier, 2012)
  19. Sattler K D (Ed.) Handbook Of Nanophysics: Principles And Methods (Boca Raton, Fl.: Taylor and Francis Group, CRC Press, 2011)
  20. Ischenko A A, Fetisov G V, Aslanov L A Nanosilicon: Properties, Synthesis, Applications, Methods Of Analysis And Control (Boca Raton, Fl.: CRC Press, 2015)
  21. Michaelsen C et al Adv. X-Ray Anal. 42 308 (2000)
  22. Kumakhov M A Proc. SPIE 4155 2 (2000)
  23. Bilderback D H X-Ray Spectrom. 32 195 (2003)
  24. Hertlein F et al Part. Part. Syst. Charact. 22 378 (2006)
  25. Shimizu K, Omote K Rigaku J. 24 1 (2008)
  26. Wohlschlögel M et al J. Appl. Cryst. 41 124 (2008)
  27. Mundboth K et al J. Synchrotron Rad. 21 16 (2014)
  28. ’l’?’?’?у’?’?’?с’?’?’? ’E ’I, ’l’?’?’?’?ь’?’? ’E ’R Fiz. Elem. Chast. At. Yad. 22 1347 (1991)
  29. Ch’?’?’?’?’?’?р’?’? ’B ’I Fiz. Elem. Chast. At. Yad. 23 785 (1992)
  30. User Manual PILATUS Detector Systems. Version 1.2, Dectris Ltd. 06.02.2009
  31. Skarzynski T Acta Cryst. D 69 1283 (2013)
  32. Dauter Z, Jaskolski M, Wlodawer A J. Synchrotron Rad. 17 433 (2010)
  33. Duke E M H, Johnson L N Proc. R. Soc. Lond. A 466 3421 (2010)
  34. ’s’?т’?с’?’? ’I ’E ’l’?’?khр’?тр’?’?’?’?’? ’?’?’?уch’?’?’?’?. ’a’?т’?’?ы ’?сс’?’?’?’?’?’?’?’?ya стру’?туры ’?’?shch’?ст’? (’a.: ’s’?’?’?’?т’?’?т, 2007)
  35. ’O’?kh’?р’?’?’? ’M ’E Usp. Fiz. Nauk 177 803 (2007); Zakharova E V Phys. Usp. 50 767 (2007), с’?. ’?’?ф’?р’?’?ts’?yu ’? ’?’?’?’?’? [34]
  36. Bolotina N B Crystallogr. Rev. 15 143 (2009)
  37. Clarck S M Crystallogr. Rev. 8 57 (2002)
  38. Dong Y-H et al J. Appl. Cryst. 36 1123 (2003)
  39. Buras B et al International Tables For Crystallography (Ed. E Prince) 3rd ed. (Dordrecht: D. Reidel Publ. Co., 2004) p. 84
  40. Kümpfe B, Luczak F, Michel B Part. Part. Syst. Charact. 22 391 (2005)
  41. Leng Y Materials Characterization: Introduction To Microscopic And Spectroscopic Methods (Singapore: John Wiley and Sons, 2008)
  42. ’z’?р’?’?-’F’?sh’?ts ’a ’B ’zр’?’?т’?ch’?с’?’?’? ’?урс р’?’?т’?’?’?’?стру’?тур’?’?’?’? ’?’?’?’?’?’?’? Т. 2 (’a.: ’R’?’?-’?’? ’a’I’p, 1960)
  43. Glatter O, Kratky O (Eds) Small Angle X-Ray Scattering (New York: Academic Press, 1982)
  44. ’l’?’?р’?у’? ’K ’R, ’s’?’?’?’?’? ’’ ’B ’i’?’?т’?’?’?’?’?с’?’?’? ’? ’?’?’?тр’?’?’?’?’? ’?’?’?’?у’?’?’?’?’?’? р’?сс’?ya’?’?’? (’a.: ’v’?у’?’?, 1986); ’z’?р. ’?’? ’?’?’?’?. ya’?., FeigL A, Svergun D I Structure Analysis By Small-Angle X-Ray And Neutron Scattering (New York: Plenum Press, 1987)
  45. Helliwell J R Macromolecular Crystallography With Synchrotron Radiation (Cambridge: Cambridge Univ. Press, 1992)
  46. Young R A (Ed.) The Rietveld Method (Oxford: Oxford Univ. Press, 1995)
  47. Ren Z et al J. Synchrotron Rad. 6 891 (1999)
  48. Will G Powder Diffraction: The Rietveld Method And The Two Stage Method To Determine And Refine Crystal Structures From Powder Diffraction Data (Berlin: Springer, 2006)
  49. Aslanov L A, Fetisov G V, Howard J A K Crystallographic Instrumentation (Oxford: Oxford Univ. Press, 1998)
  50. Ch’?р’?ыsh’?’? ’E ’E ’R’?’?. ’i’B’v ’l’?р. kh’?’?. (12) 2174 (2001); Chernyshev V V Russ. Chem. Bull. 50 2273 (2001)
  51. Ladd M, Palmer R Structure Determination By X-Ray Crystallography. Analysis By X-Rays And Neutrons 5th ed. (New York: Springer, 2013)
  52. Fawcett T et al Powder Diffr. 32 63 (2017)
  53. Billinge S J L, Thorpe M F (Eds) Local Structure From Diffraction (New York: Kluwer Acad. Publ., 2002)
  54. ’zыть’?’? Yu ’z, Sh’?sh’?’?р’?’? ’R ’B ’Fурс т’?’?р’?’? ’?’?р’?yaт’?’?ст’?’? ’? ’?’?т’?’?’?т’?ch’?с’?’?’? ст’?т’?ст’?’?’? ’?’?ya ф’?’?’?’?’?’? (’a.: ’R’?’?-’?’? ’a’I’p, 1983)
  55. Borek D, Minor W, Otwinowski Z Acta Cryst. D 59 2031 (2003)
  56. Wilson A J C International Tables For Crystallography Vol. C 1st online ed. (Dordrecht: D. Reidel Publ. Co., 2006) p. 666
  57. ’s’?т’?с’?’? ’I ’E ’B’?’?’?’?т’?ch’?с’?’?ya kh’?’?’?ya ’? ф’?’?’?’?’?-kh’?’?’?ch’?с’?’?’? ’?’?т’?’?ы ’?’?’?’?’?’?’? Т. 2 2-’? ’?’?’?. (’z’?’? р’?’?. ’B ’B ’Rshch’?’?’?’?) (’a.: ’B’?’?’?’?’?’?ya, 2012) с. 153
  58. Coolidge W D Phys. Rev. 2 409 (1913)
  59. Coolidge W D, Dempster L E, Tanis H E (Jr.) Physics 1 230 (1931)
  60. Als-Nielsen J, McMorrow D Elements Of Modern X-Ray Physics Vol. 2nd ed. (New York: John Wiley and Sons, 2011)
  61. ’n’?р’?’?’? ’R ’a Usp. Fiz. Nauk 165 429 (1995); Ternov I M Phys. Usp. 38 409 (1995)
  62. Potylitsyn A P, Vnukov I E Electron—Photon Interaction In Dense Media (Ed. H Wiedemann) (Berlin: Springer, 2002) p. 25
  63. Baryshevsky V G, Feranchuk I D, Ulyanenkov A P Parametric X-Ray Radiation In Crystals: Theory, Experiment And Applications (Berlin: Springer, 2005)
  64. Miaja-Avila L et al Struct. Dyn. 2 024301 (2015)
  65. Brenner C M et al Plasma Phys. Control. Fusion 58 014039 (2016)
  66. Mills D M et al J. Synchrotron Rad. 12 385 (2005)
  67. Attwood D, Sakdinawat A X-Rays And Extreme Ultraviolet Radiation: Principles And Applications (Cambridge: Cambridge Univ. Press, 2017)
  68. Mobilio S, Boscherini F, Meneghini C (Eds) Synchrotron Radiation. Basics, Methods And Applications (Berlin: Springer, 2015)
  69. Guinebretière R X-Ray Diffraction By Polycrystalline Materials (New York: Wiley, 2007)
  70. Wiedemann H Synchrotron Radiation (Berlin: Springer, 2003)
  71. Jaeschke E et al (Eds) Synchrotron Light Sources And Free-Electron Lasers. Accelerator Physics, Instrumentation And Science Applications (Berlin: Springer, 2016)
  72. Thompson A C et al X-Ray Data Booklet (LBNL/PUB-490 Rev. 3) 3rd ed. (Berkeley, Calif.: Lawrence Berkeley National Laboratory Univ. of California, 2009); Thompson A C et al http://xdb.lbl.gov/xdb-new.pdf
  73. Robinson A X-Ray Data Booklet (LBNL/PUB-490 Rev. 3, Ed. A C Thompson) 3rd ed. (Berkeley, Calif.: Lawrence Berkeley National Laboratory Univ. of California, 2009) p. 2-21
  74. Lightsources.org Collab. Light sources of the world, https://lightsources.org/lightsources-of-the-world/
  75. Siffalovic P et al X-Ray And Neutron Techniques For Nanomaterials Characterization (Ed. C S S R Kumar) (Berlin: Springer-Verlag, 2016) p. 507
  76. Hemberg O, Otendal M, Hertz H M Appl. Phys. Lett. 83 1483 (2003)
  77. Geloni G, Huang Z, Pellegrini C X-Ray Free Electron Lasers: Applications In Materials, Chemistry And Biology (Energy and Environment Series) Vol. 18 (Eds U Bergmann, V K Yachandra, J Yano) (London: The Royal Society of Chemistry, 2017) p. 3
  78. Leoni M, Welzel U, Scardi P J. Res. Natl. Inst. Standards Technol. 109 27 (2004)
  79. Leoni M Ischenko A A, Fetisov G V, Aslanov L A. Nanosilicon. Properties, Synthesis, Applications, Methods Of Analysis And Control (Boca Raton, FL: CRC Press, 2015) p. 519
  80. James R W The Optical Principles Of The Diffraction Of X-Rays (London: G. Bell and Sons, 1948); ’z’?р. ’?’? русс’?. ya’?., ’Kzh’?’?’?с ’i ’d’?т’?ch’?с’?’?’? ’?р’?’?ts’?’?ы ’?’?фр’?’?ts’?’? р’?’?т’?’?’?’?’?с’?’?kh ’?уch’?’? (’a.: ’R’’, 1950)
  81. Coppens P et al Synchrotron Radiation Crystallography (London: Academic Press, 1992)
  82. ’Fу’?’?’?’?’?’?’? ’I ’v Usp. Fiz. Nauk 177 384 (2007); Kulipanov G N Phys. Usp. 50 368 (2007)
  83. Margaritondo G Synchrotron Radiation. Basics, Methods And Applications (Eds S Mobilio, F Boscherini, C Meneghini) (Berlin: Springer, 2015) p. 29
  84. Wiedemann H Particle Accelerator Physics (Berlin: Springer-Verlag, 2007)
  85. Pellegrini C, Stöhr J Nucl. Instrum. Meth. Phys. Res. A 500 33 (2003)
  86. ’Fур’?’?’?’? ’E ’R, ’n’?’?ch Yu ’E Usp. Fiz. Nauk 165 241 (1995); Kurilko V I, Tkach Yu V Phys. Usp. 38 231 (1995)
  87. Huang Z, Kim K-J Phys. Rev. ST Accel. Beams 10 034801 (2007)
  88. Emma P et al Nature Photon. 4 641 (2010)
  89. Yabashi M, Tanaka H, Ishikawa T J. Synchrotron Rad. 22 477 (2015)
  90. Kim K-J et al Proc. of the Intern. Particle Accelerator Conf. IPAC’16, Busan, Korea, May 8-13, 2016 p. 801, paper MOPOW039
  91. Madsen A, Sinn H CERN Courier 57 (6) 19 (2017)
  92. Kim K-J, Shvyd’ko Yu, Reiche S Phys. Rev. Lett. 100 244802 (2008)
  93. Kim K-J, Shvyd’ko Yu V Phys. Rev. ST Accel. Beams 12 030703 (2009)
  94. Li K, Deng H Nucl. Instrum. Meth. Phys. Res. A 895 40 (2018)
  95. Chergui M, Collet E Chem. Rev. 117 11025 (2017)
  96. The European XFEL in International Comparison, https://www.xfel.eu/facility/comparison/index_eng.html
  97. Schmüser P et al Free-Electron Lasers In The Ultraviolet And X-Ray Regime (Berlin: Springer, 2014)
  98. Huang Z, Ingolf L Nature Photon. 6 505 (2012)
  99. Ishikawa T et al Nature Photon. 6 540 (2012)
  100. The European XFEL Overview, https://www.xfel.eu/facility/overview/index_eng.html
  101. Von der Linde D et al Laser Part. Beams 19 15 (2001)
  102. Jaroszynski D A et al Phil. Trans. R. Soc. Lond. A 364 689 (2006)
  103. Gauthier J-C Progress In Ultrafast Intense Laser Science Vol. 1 (Berlin: Springer, 2006) p. 151
  104. Ts’?’?’?’?yu’? Yu ’a ’sу’?’?’?’?’?’?т’?’?ь’?ы’? ’? ’?р’?’?’?’?’?’?ы’? ’?сс’?’?’?’?’?’?’?’?ya ’?’? ’?’?’?р’?тр’?’?’? (’a.: ’s’?’?’?’?т’?’?т, 2009)
  105. CORDIS: Final Report — LABSYNC, Laboratory compact light sources. Project ID: 213126. Belgium, 2012, http://cordis.europa.eu/result/rcn/54953_en.html
  106. Yamada H et al Comprehensive Biomedical Physics Vol. 8 (Ed. A Brahme) (Amsterdam: Elsevier, 2014) p. 43
  107. ’’’?’?’?’? ’B ’l ’e’?с’?’?р’?’?’?’?т’?’?ь’?ы’? ’?сс’?’?’?’?’?’?’?’?ya ’?’?р’?’?’?тр’?ch’?с’?’?’?’? р’?’?т’?’?’?’?’?с’?’?’?’? ’?’?’?уch’?’?’?ya (’a’?’?с’?: ’G’I’p, 2006)
  108. Minkov D A, Yamada H Annu. J. Electron. 166 (2014)
  109. Yamada H et al Proc. SPIE 7078 70780P (2008)
  110. Yamada H J. Synchrotron Rad. 5 1326 (1998)
  111. Yamada H AIP Conf. Proc. 716 12 (2004)
  112. Polyakov S N et al Proc. SPIE 10243 102430Y (2017)
  113. Eggl E et al J. Synchrotron Rad. 23 1137 (2016)
  114. Artyukov I A et al Laser Part. Beams 34 637 (2016)
  115. Artyukov I A et al J. Phys. Conf. Ser. 784 012002 (2017)
  116. Pfeifer T, Spielmann C, Gerber G Rep. Prog. Phys. 69 443 (2006)
  117. Macchi A A Superintense Laser-Plasma Interaction Theory Primer (Berlin: Springer, 2013)
  118. Walker P A et al J. Phys. Conf. Ser. 874 012029 (2017)
  119. Jaroszynski D A, Vieux G AIP Conf. Proc. 647 902 (2002)
  120. Leemans W P et al Nature Phys. 2 696 (2006)
  121. Leemans W, Esarey E Phys. Today 62 (3) 44 (2009)
  122. Leemans W P et al Particle Accelerator Conf., PAC’11 p. 1416, paper WEOBS1
  123. Leemans W P et al Phys. Rev. Lett. 113 245002 (2014)
  124. Esarey E, Schroeder C B, Leemans W P Rev. Mod. Phys. 81 1229 (2009)
  125. Corde S et al Rev. Mod. Phys. 85 1 (2013)
  126. Malka V Laser-Plasma Interactions And Applications (Eds P McKenna et al) (Berlin: Springer, 2013) p. 281
  127. Wang X et al Nature Commun. 4 1988 (2013)
  128. Rini M Physics 7 126 (2014)
  129. ’F’?стyu’?’?’? ’R Yu, ’zуkh’?’? ’B ’a Usp. Fiz. Nauk 185 89 (2015); Kostyukov I Yu, Pukhov A M Phys. Usp. 58 81 (2015)
  130. Maier A R, Kirchen M, Grüner F Synchrotron Light Sources And Free-Electron Lasers (Eds E Jaeschke et al) (Cham: Springer, 2016) p. 225
  131. Giulietti D, Gizzi L A Riv. Nuovo Cimento 21 1 (1998)
  132. ’Bрts’?’?’?’?’?ch ’’ ’B, ’l’?’?’?’?’?’? ’i ’O ’s’?’?’?’?’? ’?’?’?’?’?ы ’?’?ya ф’?’?’?’?’?’? (’a.: ’Bт’?’?’?’?’?’?т, 1979)
  133. Rousse A et al Phys. Rev. E 50 2200 (1994)
  134. Jiang Z et al Phys. Plasmas 2 1702 (1995)
  135. Schwoerer H Femtosecond Technology For Technical And Medical Applications (Eds F Dausinger, F Lichtner, H Lubatschowski) (Berlin: Springer-Verlag, 2004) p. 235
  136. Gibbon P Short Pulse Laser Interactions With Matter: An Introduction (London: Imperial College Press, 2005)
  137. Tsу’?’?р’?’?’? ’E ’B, ’n’?р’?с’?’?’? ’’ ’E, ’’’?’?’?’? ’l ’R Usp. Fiz. Nauk 103 319 (1971); Tsukerman V A, Tarasova L V, Lobov S I Sov. Phys. Usp. 14 61 (1971)
  138. Mead S W et al Appl. Opt. 11 345 (1972)
  139. Mallozzi P J et al J. Appl. Phys. 45 1891 (1974)
  140. Rumsby P T J. Microsc. 138 245 (1985)
  141. ’E’?’?’?’?р’?’?’?’? ’B ’E, Sh’?ya’?ts’?’? ’E ’v Kvantovaya Elektron. 14 5 (1987); Vinogradov A V, Shlyaptsev V N Sov. J. Quantum Electron. 17 1 (1987)
  142. ’I’?’?’?’?’?’? ’M ’I, ’i’?’?’?’?’?’? ’E ’G ’s’?’?’?ch’?с’?’?ya э’?ts’?’?’?’?’?’?’?’?ya Vol. 2 (’I’?. р’?’?. ’B ’a ’zр’?kh’?р’?’?, 1990) p. 552
  143. ’B’?’?р’?’?’? ’B ’B, Yash’?’? ’E ’M, Ch’?руkhch’?’? ’B ’E Usp. Fiz. Nauk 169 72 (1999); Andreev A A, Yashin V E, Charukhchev A V Phys. Usp. 42 66 (1999)
  144. Wharton K B et al Phys. Rev. E 64 025401(R) (2001)
  145. ’Rshch’?’?’?’? ’B ’B ’? ’?р Usp. Fiz. Nauk 184 681 (2014); Ishchenko A A et al Phys. Usp. 57 633 (2014)
  146. Ischenko A A, Weber P M, Miller R J D ’pс’?’?kh’? kh’?’?’?’? 86 1173 (2017); Ischenko A A, Weber P M, Miller R J D Russ. Chem. Rev. 86 1173 (2017)
  147. ’Rshch’?’?’?’? ’B ’B ’lтру’?тур’? ’? ’?’?’?’?’?’?’?’? с’?’?’?’?’?’?ыkh ’?’?’?’?’?у’? ’? ’?’?’?’?’?’?с’?р’?’?’?’?’?’?’?’? ’?’?shch’?ст’?’? (’a.: ’s’?’?’?’?т’?’?т, 2018)
  148. Ditmire T et al Radiat. Phys. Chem. 70 535 (2004)
  149. Compant La Fontaine A, Courtois C, Lefebvre E Phys. Plasmas 19 023104 (2012)
  150. Mulser P, Sigel R, Witkowski S Phys. Rep. 6 187 (1973)
  151. ’I’?р’?’?’?’?’?’? ’E ’a, ’l’?’?’?’?ь’?’? ’B ’G Usp. Fiz. Nauk 169 78 (1999); Gordienko V M, Savel’ev A B Phys. Usp. 42 72 (1999)
  152. Jiang Y, Lee T, Rose-Petruck C G J. Opt. Soc. Am. B 20 229 (2003)
  153. Ledingham K W D et al arXiv:1106.4152
  154. Mourou G A, Tajima T, Bulanov S V Rev. Mod. Phys. 78 309 (2006)
  155. Perry M D, Mourou G Science 264 917 (1994)
  156. Umstadter D J. Phys. D 36 R151 (2003)
  157. Joshi C J, Corkum P B Phys. Today 48 (1) 36 (1995)
  158. Popmintchev T et al Science 336 1287 (2012)
  159. Gibbon P CERN Yellow Report CERN-2016-001 (Geneva: CERN, 2016); Gibbon P arXiv:1705.10529
  160. Elsaesser T, Woerner M Acta Cryst. A 66 168 (2010)
  161. Zamponi F et al Appl. Phys. A 96 51 (2009)
  162. Fullagar W et al Rev. Sci. Instrum. 78 115105 (2007)
  163. Bargheer M et al Appl. Phys. B 80 715 (2005)
  164. Edwards R D et al Appl. Phys. Lett. 80 2129 (2002)
  165. Andreev A A et al Phys. Rev. E 65 026403 (2002)
  166. Salzmann D et al Phys. Rev. E 65 036402 (2002)
  167. ’B’?’?р’?’?’? ’B ’B, ’z’?’?т’?’?’?’? ’F Yu Kvantovaya Elektron. 41 515 (2011); Andreev A A, Platonov K Yu Quantum Electron. 41 515 (2011)
  168. Tajima T, Dawson J M Phys. Rev. Lett. 43 267 (1979)
  169. Esarey E et al IEEE Trans. Plasma Sci. 24 252 (1996)
  170. Hooker S M Nature Photon. 7 775 (2013)
  171. Stephan F, Krasilnikov M Synchrotron Light Sources And Free-Electron Lasers: Accelerator Physics, Instrumentation And Science Applications (Eds E J Jaeschke, S Khan, J R Schneider) (New York: Springer, 2016) p. 561
  172. Fuchs M et al Nature Phys. 5 826 (2009)
  173. Korn G Physics 7 125 (2014)
  174. Loulergue A et al New J. Phys. 17 023028 (2015)
  175. Jenkins R, Snyder R L Introduction To X-Ray Powder Diffractometry (New York: Wiley, 1996)
  176. Mathieu M, Steier V Xenocs News Lett. 8 1 (2008)
  177. Schulz T et al J. Appl. Cryst. 42 885 (2009)
  178. MacDonald C A X-Ray Opt. Instrum. 2010 867049 (2010)
  179. MacDonald C A, Owens S M, Gibson W M J. Appl. Cryst. 32 160 (1999)
  180. Kumakhov M A Proc. SPIE 5943 59430B (2006)
  181. Kumakhov M A Proc. SPIE 4765 20 (2002)
  182. Gibson D, Gibson W Adv. X-Ray Anal. 45 286 (2002)
  183. Cornaby S et al Adv. X-Ray Anal. 50 194 (2006)
  184. Bjeoumikhov A, Bjeoumikhova S, Wedell R Part. Part. Syst. Charact. 22 384 (2005)
  185. ’G’?’?’?т’?’?’?’? ’B ’? ’?р ’B’?’?’?’?т’?’?’? (4) 14 (2012)
  186. Arndt U W J. Appl. Cryst. 23 161 (1990)
  187. Bjeoumikhov A et al X-Ray Spectrom. 34 493 (2005)
  188. Schields P J et al Powder Diffraction 17 (2) 70 (2002)
  189. Hart M, Berman L Acta Cryst. A 54 850 (1998)
  190. Schuster M et al Proc. SPIE 3767 183 (1999)
  191. Schuster S M, Göbel H Adv. X-Ray Anal. 39 57 (1997)
  192. Yang C, Courville A, Ferrara J D Acta Cryst. D 55 1681 (1999)
  193. Wiesmann J et al Acta Cryst. A 66 s291 (2010)
  194. Omote K, Harada J Adv. X-Ray Anal. 43 192 (2000)
  195. Bergmann A et al J. Appl. Cryst. 33 869 (2000)
  196. Vetterling W T, Pound R V J. Opt. Soc. Am. 66 1048 (1976)
  197. Kumakhov M A Nucl. Instrum. Meth. Phys. Res. B 48 283 (1990)
  198. Gubarev M et al J. Appl. Cryst. 33 882 (2000)
  199. Engström P et al Nucl. Instrum. Meth. Phys. Res. B 36 222 (1989)
  200. Huang R, Bilderback D H J. Synchrotron Rad. 13 74 (2006)
  201. Gillilan R E et al J. Synchrotron Rad. 17 227 (2010)
  202. ’Bр’?’?’?ь’?’? ’E ’B, ’Fу’?’?kh’?’? ’a ’B, ’s’?ya’?’?’? ’i ’s ’z’?сь’?’? Zh’n’s 14 226 (1988); Arkad’ev V A, Kumakhov M A, Fayazov R F Sov. Tech. Phys. Lett. 14 101 (1988)
  203. ’Gуshу’?’? ’E ’B, ’dру’?zh’?’?’?’?’? ’a ’v, ’Fу’?ь’?’?’? ’i ’v Becт’?. ’a’I’p. Cep. 3, ’s’?’?’?’?’?. ’Bстр’?’?’?’?’?ya 31 (1) 76 (1990)
  204. Bjeoumikhov A et al X-Ray Spectrom. 33 312 (2004)
  205. Engström P et al Nucl. Instrum. Meth. Phys. Res. A 302 547 (1991)
  206. Riekel C et al Macromolecules 30 1033 (1997)
  207. Oosterkamp W J, Philips L Res. Rep. 3 303 (1948)
  208. ’z’?’?’?р’?т’?’? ’M ’’, Chkh’?’?’? ’v ’R Teplofiz. Vys. Temp. 44 770 (2006); Pankratov E L, Chkhalo N I High Temp. 44 766 (2006)
  209. Lundström U MetalJet X-Ray Sources for High Intensity X-Ray Beams. NIS Colloquium, X-Ray Induced Modifications in Materials: Applications and Challenges (Torino: Univ. di Torino, 2017); Lundström U http://www.solid.unito.it/XIMM/EXCILLUM.pdf
  210. Wiesmann J et al Part. Part. Syst. Charact. 26 112 (2009)
  211. Rackwitz V J. Anal. Atom. Spectrom. 26 499 (2011)
  212. Rackwitz V, Warrikhoff A, Hodoroab V-D J. Anal. Atom. Spectrom. 29 458 (2014)
  213. Hemberg O E, Otendal M, Hertz H M Opt. Eng. 43 1682 (2004)
  214. Larsson D et al Rev. Sci. Instrum. 82 123701 (2011)
  215. Espes E et al Proc. SPIE 9212 92120J (2014)
  216. Graf J et al Acta Cryst. A 73 C1249 (2017)
  217. Arndt U W, Gilmore D J J. Appl. Cryst. 12 1 (1979)
  218. ’Bс’?’?’?’?’? ’’ ’B ’R’?стру’?’?’?т’?’?ь’?ы’? ’?’?т’?’?ы р’?’?т’?’?’?’?стру’?тур’?’?’?’? ’?’?’?’?’?’?’? (’a.: ’R’?’?-’?’? ’a’I’p, 1983)
  219. He B B Two-Dimensional X-Ray Diffraction 2nd ed. (Hoboken, NJ: Wiley, 2018)
  220. Namatane Y et al Rigaku J. 34 (1) 9 (2018)
  221. Hinrichsen B, Dinnebier R E, Jansen M Powder Diffraction: Theory And Practice (Eds R E Dinnebier, S J L Billinge) (Cambridge: Royal Society of Chemistry) 14 (2008)
  222. Ponchut C J. Synchrotron Rad. 13 195 (2006)
  223. Madden T et al J. Phys. Conf. Ser. 493 012016 (2014)
  224. Ohbuchi A Rigaku J. 31 (1) 4 (2015)
  225. Basolo S et al J. Synchrotron Rad. 14 151 (2007)
  226. Chupas P J et al J. Appl. Cryst. 36 1342 (2003)
  227. Billinge S J L Z. Kristallogr. Suppl. 26 17 (2007)
  228. Toby B H et al J. Appl. Cryst. 46 1058 (2013)
  229. Gelisio L, Scardi P Acta Cryst. A 72 608 (2016)
  230. Gruner S M, Tate M W, Eikenberry E F Rev. Sci. Instrum. 73 2815 (2002)
  231. Klein C marXperts GmbH, Application Note (2014)
  232. Amemiya Y et al Nucl. Instrum. Meth. Phys. Res. A 266 645 (1988)
  233. Dauter Z, Wilson K S Acta Phys. Polon. A 86 477 (1994)
  234. He T et al Proc. SPIE 8142 81421Q (2011)
  235. Product Sheet SC-XRD 31, Order No. DOC-S86-EXS031 V2. Bruker AXS Inc. (2011)
  236. Brönnimann C, Trüb P Synchrotron Light Sources And Free-Electron Lasers (Eds E Jaeschke, S Khan, J R Schneider) (New York: Springer, 2016) p. 995
  237. Schmitt B et al Nucl. Instrum. Meth. Phys. Res. A 518 436 (2004)
  238. Hülsen G et al AIP Conf. Proc. 705 1009 (2004)
  239. Philips Analytical X’Celerator J. Appl. Cryst. 34 538 (2001)
  240. Dauter Z Acta Cryst. D 55 1703 (1999)
  241. Pflugrath J W Acta Cryst. D 55 1718 (1999)
  242. Mueller M, Wang M, Schulze-Briese C Acta Cryst. D 68 42 (2012)
  243. STOE X-area software manual. STOE and Cie GmbH. September 21 (2011)
  244. Wenger E et al Acta Cryst. B 70 783 (2014)
  245. Webb J E Patent US 3415992 A. Published 10.12.1968, Filed 28.12.1965
  246. Pennicard D et al MRS Bull. 42 445 (2017)
  247. Lowe B G, Sareen R A Semiconductor X-Ray Detectors (Boca Raton, Fl.: CRC Press, 2014)
  248. Awadalla S, Iniewski K (Eds) Solid-State Radiation Detectors: Technology And Applications (Boca Baton, Fl.: CRC Press, 2015)
  249. Boudet N et al Nucl. Instrum. Meth. Phys. Res. A 510 41 (2003)
  250. Dinapoli R et al Nucl. Instrum. Meth. Phys. Res. A 650 79 (2011)
  251. Hamstra R H, Wendland P Appl. Opt. 11 1539 (1972)
  252. Jach T Nucl. Instrum. Meth. Phys. Res. A 299 76 (1990)
  253. Kirkland J P et al Nucl. Instrum. Meth. Phys. Res. A 266 602 (1988)
  254. Broennimann Ch et al J. Synchrotron Rad. 13 120 (2006)
  255. Henrich B et al Nucl. Instrum. Meth. Phys. Res. A 607 247 (2009)
  256. Donath T et al J. Phys. Conf. Ser. 425 062001 (2013)
  257. Hatsui T, Graafsma H IUCrJ 2 371 (2015)
  258. Ramírez-Jiménez F J AIP Conf. Proc. 857 121 (2006)
  259. Kriegner D et al J. Appl. Cryst. 48 613 (2015)
  260. Gerndt E et al Nucl. Instrum. Meth. Phys. Res. A 624 350 (2010)
  261. Gao M et al J. Appl. Cryst. 49 1182 (2016)
  262. "XtaLAB P200" Rigaku J. 29 (2) 26 (2013)
  263. Shiramata Y Rigaku J. 32 (1) 3 (2016)
  264. "High-resolution/high-speed 2D photon counting X-ray detector HyPix-300" Rigaku J. 30 (2) 38 (2014)
  265. Michaelsen C et al Adv. X-Ray Anal. 42 308 (2000)
  266. Hasse B et al Proc. SPIE 10387 103870B (2017)
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