A reciprocal space mapping technique with the use of three-crystal X-ray diffractometry with a time resolution was developed and implemented on a laboratory X-ray source for the first time. This technique makes it possible to study the fast processes that occur in the sample under external actions that cause reversible deformations of its crystal lattice and to distinguish these processes in time, as well as to distinguish different kinds of crystal deformations caused by these actions. The essence of the technique is to measure the time dependences of the intensity for each point of the reciprocal space in the vicinity of the diffraction maximum in three-axis diffraction geometry by subjecting the sample to repeated and structurally identical action of a high-intensity electric field, with the subsequent construction of the time evolution of the two-dimensional reciprocal space map. The time resolution is achieved with use of a high-speed multichannel intensity analyzer synchronized with a high-voltage source. The results of the reciprocal space mapping with a laboratory radiation source with a time resolution of up to 10 ms are demonstrated for a piezoelectric crystal of lanthanum gallium silicate subjected to external electric field of intensity 3.08 kV mm−1, which is close to the breakdown of the sample.
Keywords: time-resolved technique, reciprocal space map, triple-crystal X-ray diffractometry, external electric field, piezoelectric effect, langasite PACS:06.60.Jn DOI:10.3367/UFNe.2018.06.038348 URL: https://ufn.ru/en/articles/2019/2/d/ Citation: Marchenkov N V, Kulikov A G, Atknin I I, Petrenko A A, Blagov A E, Kovalchuk M V "Time-resolved X-ray reciprocal space mapping of the crystal under external electric field" Phys. Usp.62 179–185 (2019)