Strongly correlated electron systems and quantum critical phenomena

 a,  b,  c,  c
a Lebedev Physical Institute, Russian Academy of Sciences, Leninsky prosp. 53, Moscow, 119991, Russian Federation
b Prokhorov General Physics Institute of the Russian Academy of Sciences, ul. Vavilova 38, Moscow, 119942, Russian Federation
c Institute for High Pressure Physics, Russian Academy of Sciences, Troitsk, Moscow, Russian Federation

The first seminar ’Strongly correlated electron systems and quantum critical phenomena’ was held on April 11, 2003 at the L F Vereshchagin Institute for High Pressure Physics (or IHPP) of the Russian Academy of Sciences (RAS), located in Troitsk, Moscow region. We believe this to have been an important event because no special conferences or seminars devoted exclusively to the physics of strongly correlated systems had been organized in the past in Russia; relevant problems of this kind were discussed at broader scientific gatherings, such as meetings devoted to low-temperature physics. A report on the proceedings of that seminar can be found in the April issue of Phys. Usp. 47 401 (2004). With the support of the Presidium of the RAS, on June 11, 2004, the second workshop ’Strongly correlated electron systems and quantum critical phenomena’ was again held at IHPP. Note that, compared to the 2003 seminar, the number of reports more than doubled and amounted to 23 oral reports and 19 poster reports.

Fulltext is available at IOP
PACS: 71.10.−w, 71.10.Hf, 71.27.+a, 71.30.+h (all)
DOI: 10.1070/PU2005v048n10ABEH002834
Citation: Arseev P I, Demishev S V, Ryzhov V N, Stishov S M "Strongly correlated electron systems and quantum critical phenomena" Phys. Usp. 48 1071–1084 (2005)
BibTexBibNote ® (generic)BibNote ® (RIS)MedlineRefWorks

Оригинал: Арсеев П И, Демишев С В, Рыжов В Н, Стишов С М «Сильно коррелированные электронные системы и квантовые критические явления» УФН 175 1125–1139 (2005); DOI: 10.3367/UFNr.0175.200510m.1125

Cited by (1)

© 1918–2022 Uspekhi Fizicheskikh Nauk
Email: Editorial office contacts About the journal Terms and conditions