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Semiconductor microcavity polaritons


Institute of Spectroscopy, Russian Academy of Sciences, ul. Fizicheskaya 5, Troitsk, Moscow, 108840, Russian Federation

The optical properties of wide-gap semiconductor films on metal substrates were investigated experimentally by infrared spectroscopy, Raman scattering, and femtosecond spectroscopy techniques as well as theoretically in the framework of linear crystal optics. The optical spectra of such planar structures (microresonators) were shown to bear information on electromagnetic excitations of both the surface and the volume of the structure. The optical spectra are determined by the interaction of all dipole-active excitations of the component materials with the electromagnetic modes of the microresonator, which in turn are determined by the permittivities of each component material, microcavity (microresonator) thickness, and the experimental conditions.

Fulltext is available at IOP
PACS: 71.36.+c, 78.20.Bh, 78.40.−q, 78.66.−w (all)
DOI: 10.1070/PU2002v045n12ABEH001189
URL: https://ufn.ru/en/articles/2002/12/b/
Citation: Vinogradov E A "Semiconductor microcavity polaritons" Phys. Usp. 45 1213–1250 (2002)
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Оригинал: Виноградов Е А «Поляритоны полупроводниковой микрополости» УФН 172 1371–1410 (2002); DOI: 10.3367/UFNr.0172.200212b.1371

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