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Low-temperature scanning tunneling microscopy

V.S. Edel’man
Kapitza Institute of Physical Problems, Russian Academy of Sciences, ul. Kosygina 2, Moscow, 117334, Russian Federation

PACS: 07.20.Mc, 07.79.−v, 07.79.Cz, 68.35.Bs (all)
DOI: 10.1070/PU2000v043n09ABEH000807
URL: https://ufn.ru/en/articles/2000/9/e/
Web of Science

Web of Science

000165206800005
Citation: Edel’man V S "Low-temperature scanning tunneling microscopy" Phys. Usp. 43 925–926 (2000)

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PT Journal Article
TI Low-temperature scanning tunneling microscopy
AU Edel’man V S
FAU Edel’man VS
DP 10 Sep, 2000
TA Phys. Usp.
VI 43
IP 9
PG 925-926
RX 10.1070/PU2000v043n09ABEH000807
URL https://ufn.ru/en/articles/2000/9/e/
SO Phys. Usp. 2000 Sep 10;43(9):925-926

Оригинал: Эдельман В С «Низкотемпературная сканирующая тунельная микроскопия» УФН 170 995–996 (2000); DOI: 10.3367/UFNr.0170.200009e.0995

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