Exchange effects in shot noise in multi-terminal devices

Ya.M. Blanter^a, S.A. van Langen^b, M. Buttiker^c
^aMoscow State Institute of Steel and Alloys (Technology University), Leninskii prosp. 4, Moscow, 117936, Russian Federation
^bInstitut-Lorentz, Leiden University, Leiden, The Netherlands
^cGeneva University, Geneva, Switzerland

PACS: 72.70.+m, 73.40.Hm, 73.50.Td (all)
DOI: 10.1070/PU1998v041n02ABEH000349
URL: https://ufn.ru/en/articles/1998/2/n/
Web of Science

000072729300013
Citation: Blanter Ya M, van Langen S A, Buttiker M "Exchange effects in shot noise in multi-terminal devices" Phys. Usp. 41 149–152 (1998)

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PT Journal Article
TI Exchange effects in shot noise in multi-terminal devices
AU Blanter Ya M
FAU Blanter YM
AU van Langen S A
FAU van Langen SA
AU Buttiker M
FAU Buttiker M
DP 10 Feb, 1998
TA Phys. Usp.
VI 41
IP 2
PG 149-152
RX 10.1070/PU1998v041n02ABEH000349
URL https://ufn.ru/en/articles/1998/2/n/
SO Phys. Usp. 1998 Feb 10;41(2):149-152

Оригинал: Блантер Я М, Ван Ланген С А, Бюттикер М «Влияние обменных эффектов на дробовой шум в многоконтактных проводниках» УФН 168 159–162 (1998); DOI: 10.3367/UFNr.0168.199802m.0159