Exchange effects in shot noise in multi-terminal devices

Ya.M. Blanter^a, S.A. van Langen^b, M. Buttiker^c
^aMoscow State Institute of Steel and Alloys (Technology University), Leninskii prosp. 4, Moscow, 117936, Russian Federation
^bInstitut-Lorentz, Leiden University, Leiden, The Netherlands
^cGeneva University, Geneva, Switzerland

PACS: 72.70.+m, 73.40.Hm, 73.50.Td (all)
DOI: 10.1070/PU1998v041n02ABEH000349
URL: https://ufn.ru/en/articles/1998/2/n/
Web of Science

000072729300013
Citation: Blanter Ya M, van Langen S A, Buttiker M "Exchange effects in shot noise in multi-terminal devices" Phys. Usp. 41 149–152 (1998)

BibTexBibNote ® (generic)BibNote ® (RIS)MedlineRefWorks

@article{Blanter:1998,
	author = {Ya. M. Blanter and S. A. van Langen and M. Buttiker},
	title = {Exchange effects in shot noise in multi-terminal devices},
	publisher = {Physics-Uspekhi},
	year = {1998},
	journal = {Phys. Usp.},
	volume = {41},
	number = {2},
	pages = {149-152},
	url = {https://ufn.ru/en/articles/1998/2/n/},
	doi = {10.1070/PU1998v041n02ABEH000349}
}

Оригинал: Блантер Я М, Ван Ланген С А, Бюттикер М «Влияние обменных эффектов на дробовой шум в многоконтактных проводниках» УФН 168 159–162 (1998); DOI: 10.3367/UFNr.0168.199802m.0159