 |
RSS feeds |
|
|||||
| Issue 4, 2024 |
|
||||||
|
|
|
||||||
PACS numbers
68.35.Dv Composition, segregation; defects and impurities
-
V.A. Gritsenko “Structure of silicon/oxide and nitride/oxide interfaces” 52 869–877 (2009)
61.43.−j, 61.66.Fn, 68.35.Dv, 71.55.Jv () -
V.A. Gritsenko “Atomic structure of the amorphous nonstoichiometric silicon oxides and nitrides” 51 699–708 (2008)
33.60.Fy, 61.43.−j, 61.66.Fn, 68.35.Dv, 71.55.Jv () -
V.A. Trapeznikov “Study of surface layers by the method of electron spectroscopy” 28 274–276 (1985)
68.35.Dv, 79.60.Bm, 79.20.Fv, 81.65.Mq, 81.65.Cf, 68.35.Gy ()
|
© 1918–2024 Uspekhi Fizicheskikh Nauk Email: ufn@ufn.ru Editorial office contacts About the journal Terms and conditions |