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Приборы и методы исследований


Рентгеновская микроскопия


Федеральный научно-исследовательский центр "Кристаллография и фотоника" РАН, Институт кристаллографии им. А.В.Шубникова РАН, Ленинский просп. 59, Москва, 119333, Российская Федерация

Рентгеновская микроскопия предназначена для получения изображения исследуемого объекта в реальном пространстве в двух или трёх измерениях с использованием элементов фокусирующей оптики. Описаны различные типы микроскопов, области их применения, а также способы получения контраста изображений. Обсуждаются пути дальнейшего развития рентгеновской микроскопии.

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English fulltext is available at DOI: 10.3367/UFNe.2016.06.037830
Ключевые слова: рентгеновские лучи, рентгеновская оптика, микроскопия, спектроскопия, топография, флуоресценция, магнитный дихроизм
PACS: 07.85.Tt, 41.50.+h (все)
DOI: 10.3367/UFNr.2016.06.037830
URL: https://ufn.ru/ru/articles/2017/2/f/
Цитата: Лидер В В "Рентгеновская микроскопия" УФН 187 201–219 (2017)
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Поступила: 25 апреля 2016, доработана: 30 мая 2016, 9 июня 2016

English citation: Lider V V “X-ray microscopyPhys. Usp. 60 187–203 (2017); DOI: 10.3367/UFNe.2016.06.037830

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