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Механизм убегания электронов в плотных газах и формирование мощных субнаносекундных электронных пучков

 а,  б
а Институт сильноточной электроники СО РАН, пр. Академический 2/3, Томск, 634055, Российская Федерация
б Институт общей физики им. А.М. Прохорова Российской академии наук, ул. Вавилова 38, Москва, 119991, Российская Федерация

Рассматривается новое понимание механизма генерации пучка убегающих электронов в газах. Показано, что таунсендовский механизм размножения электронов справедлив даже для сильных полей, при которых можно пренебречь ионизационным трением электронов. Предложен нелокальный критерий убегания, определяющий универсальную для данного газа двузначную зависимость критического напряжения от pd (p — давление газа, d — расстояние между электродами), имеющую в отличие от известных кривых Пашена дополнительную верхнюю ветвь и разделяющую разрядный промежуток на область эффективного размножения электронов и область, которую они покидают, не успев размножиться. Обсуждаются эксперименты по получению пучков с субнаносекундной длительностью импульса и амплитудой в десятки-сотни ампер при атмосферном давлении различных газов, а также реализация объемного наносекундного разряда с большой удельной мощностью возбуждения без предыонизации разрядного промежутка от дополнительного источника.

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English fulltext is available at DOI: 10.1070/PU2004v047n09ABEH001790
PACS: 41.75.Fr, 51.50.+v, 52.80.Dy (все)
DOI: 10.3367/UFNr.0174.200409b.0953
URL: https://ufn.ru/ru/articles/2004/9/b/
000226203600002
2004PhyU...47..887T
Цитата: Тарасенко В Ф, Яковленко С И "Механизм убегания электронов в плотных газах и формирование мощных субнаносекундных электронных пучков" УФН 174 953–971 (2004)
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English citation: Tarasenko V F, Yakovlenko S I “The electron runaway mechanism in dense gases and the production of high-power subnanosecond electron beams” Phys. Usp. 47 887–905 (2004); DOI: 10.1070/PU2004v047n09ABEH001790

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