Accepted articles

Reviews of topical problems


Metalenses for subwavelength imaging

 a,  b,  a,  a,  c,  a, c
a ITMO University, Kronverksky Pr. 49, bldg. A, St. Petersburg, 197101, Russian Federation
b Kazan Federal University, Institute of Physics, 16 Kremlyovskaya str, Kazan, 420008, Russian Federation
c Aalto University, School of Electrical Engineering, P.O. Box 11000, Aalto, FI-00076, Finland

This review discusses real-time subwavelength optical imaging devices, namely metalenses.

Keywords: diffraction limit, subwavelength resolution, near field, materials with a negative refractive index, plasmon
PACS: 42.30.−d
DOI: 10.3367/UFNe.2021.03.038952
Citation: Baryshnikova K V, Kharintsev S S, Belov P A, Ustimenko N A, Tretyakov S A, Simovskii C R "Metalenses for subwavelength imaging" Phys. Usp., accepted

Received: 26th, August 2020, revised: 12th, March 2021, 19th, March 2021

Оригинал: Барышникова К В, Харинцев С С, Белов П А, Устименко Н А, Третьяков С А, Симовский К Р «Металинзы для получения изображений с субволновым разрешением» УФН, принята к публикации; DOI: 10.3367/UFNr.2021.03.038952

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