Accepted articles

Reviews of topical problems


Precision crystal lattice parameters determination


Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion

Precision X-ray methods for absolute and relative determination of crystal lattice parameters (interplanar distances) are described and compared, including X-ray divergent-beam (Kossel) technique, the Bond method, the Renninger method, the back reflection method, the interference method, the method of standards. It is shown that for most of the considered methods, usually the relative accuracy of ~ 10−5—10−6 for lattice parameters determination is achievable, for the last two methods give much greater accuracy, at the level of ~ 10−8—10−9.

PACS: 06.20.Jr, 07.85.−m, 61.50.−f, 61.10.Nz (all)
DOI: 10.3367/UFNe.2019.07.038599
Citation: Lider V V "Precision crystal lattice parameters determination" Phys. Usp., accepted

Received: 14th, May 2019, revised: 1st, July 2019, 2nd, July 2019

Оригинал: Лидер В В «Прецизионное определение параметров кристаллической решетки» УФН, принята к публикации; DOI: 10.3367/UFNr.2019.07.038599

Similar articles (15) ↓

  1. V.V. Lider “Multilayer X-ray interference structures62 1063–1095 (2019)
  2. A.I. Gusev “High-energy ball milling of nonstoichiometric compounds63 342–364 (2020)
  3. D.M. Vasil’ev, B.I. Smirnov “Certain X-RAY diffraction methods of investigating cold worked metals4 226–259 (1961)
  4. N.N. Kolachevsky “Laboratory search for time variation in the fine structure constant47 1101–1118 (2004)
  5. V.L. Indenbom, F.N. Chukhovskii “The problem of image formation in X-RAY optics15 298–317 (1972)
  6. G.V. Fetisov “X-ray diffraction methods for structural diagnostics of materials: progress and achievements63 2–32 (2020)
  7. V.V. Lider “X-ray holography58 365–383 (2015)
  8. Yu.S. Terminasov, L.V. Tuzov “Double reflections of X Rays in crystals7 434–456 (1964)
  9. R.I. Garber, A.I. Fedorenko “Focusing of atomic collisions in crystals7 479–507 (1965)
  10. Yu.G. Poltavtsev “Structure of semiconductors in noncrystalline states19 969–987 (1976)
  11. S.G. Turyshev “Experimental tests of general relativity: recent progress and future directions52 1–27 (2009)
  12. E.V. Suvorov, I.A. Smirnova “X-ray diffraction imaging of defects in topography (microscopy) studies58 833–849 (2015)
  13. G.N. Makarov “Kinetic methods for measuring the temperature of clusters and nanoparticles in molecular beams54 351–370 (2011)
  14. V.I. Punegov “High-resolution X-ray diffraction in crystalline structures with quantum dots58 419–445 (2015)
  15. Z.D. Kvon, D.A. Kozlov et alTopological insulators based on HgTe63 (7) (2020)

The list is formed automatically.

© 1918–2020 Uspekhi Fizicheskikh Nauk
Email: ufn@ufn.ru Editorial office contacts About the journal Terms and conditions