V.V. Lider Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion
Precision X-ray methods for absolute and relative determination of crystal lattice parameters (interplanar distances) are described and compared, including X-ray divergent-beam (Kossel) technique, the Bond method, the Renninger method, the back reflection method, the interference method, the method of standards. It is shown that for most of the considered methods, usually the relative accuracy of ~ 10−5—10−6 for lattice parameters determination is achievable, for the last two methods give much greater accuracy, at the level of ~ 10−8—10−9.