Accepted articles

Reviews of topical problems

Multilayer x-ray interference structures

Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion

The work is devoted to the principles, current state and problems of multilayer X -ray optics. Optimization methods of planar multilayer interference structures and multilayer diffraction gratings, their application in science and technology are discussed.

Text is available here.

Keywords: multilayer systems, diffraction gratings, X-rays, X-ray optics, diffraction, interference, spectral resolution
PACS: 07.85.−m, 41.50.+h, 42.79.Dj, 42.88.+h, 61.05.cp, 78.20.Bh, 78.67.Pt, 95.55.Ka (all)
DOI: 10.3367/UFNe.2018.10.038439
Citation: Lider V V "Multilayer x-ray interference structures" Phys. Usp., accepted

Received: 12th, July 2018, revised: 24th, September 2018, 4th, October 2018

Оригинал: Лидер В В «Многослойные рентгеновские интерференционные структуры» УФН, принята к публикации; DOI: 10.3367/UFNr.2018.10.038439

© 1918–2019 Uspekhi Fizicheskikh Nauk
Email: Editorial office contacts About the journal Terms and conditions