Accepted articles

Reviews of topical problems


X-ray diffraction methods for structural diagnostics of materials: progress and achievements


Lomonosov Moscow State University, Department of Chemistry, Leninskie Gory 1, str. 3, Moscow, 119991, Russian Federation

The review describes the improvement of X-ray diffractometry at the turn of the 20th and 21st centuries for structural studies, both with the use of traditional continuously radiating X-ray generators and the latest sources of ultrashort and ultra-bright X-ray pulses, which make it possible to investigate the structural dynamics of a condensed matter in a 4D space-time continuum with a resolution of up to a tenth fraction of femtoseconds. Mainly new technical means to increase the sensitivity, accuracy and efficiency of X-ray diffraction experiments are discussed: new and promising sources of X-rays, reflective collimating and focusing X-ray optics, fast low-noise and radiation-resistant position sensitive X-ray detectors, and new generation X-ray diffractometers based on these elements. The greatest attention is paid to modern technical solutions that ensure university and industrial laboratories to conduct locally the X-ray diffraction studies which previously were considered possible only with synchrotron radiation at international collective use centers.

Text is available here.

Keywords: X-ray diffraction methods, X-ray diffraction analysis, X-ray diffractometers, X-ray diffractometry, pulse sources of x-rays, laser-plasma sources of X-rays, laser-plasma electron accelerators, microfocus sources of X-rays, alternative sources of x-rays, X-ray free-electron lasers (XFEL), reflective x-ray optics, multilayer thin-film X-ray reflectors, monocapillary X-ray collimators, polycapillary x-ray optics, semiconductor position-sensitive X-ray detectors, microstrip silicon detectors, two-dimensional hybrid pixel detectors, X-ray p-i-n-diodes, structural dynamics of a condensed substance in a 4D space-time continuum
DOI: 10.3367/UFNe.2018.10.038435
Citation: Fetisov G V "X-ray diffraction methods for structural diagnostics of materials: progress and achievements" Phys. Usp., accepted

Received: 10th, August 2018, revised: 15th, September 2018, 4th, October 2018

Оригинал: Фетисов Г В «Рентгеновские дифракционные методы структурной диагностики материалов: прогресс и достижения» УФН, принята к публикации; DOI: 10.3367/UFNr.2018.10.038435

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