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Precision imaging multilayer optics for soft X-rays and extreme ultraviolet bands

, , , ,
Institute for Physics of Microstructures, Russian Academy of Sciences, ul. Ul'yanova 46, Nizhnii Novgorod, 603950, Russian Federation

Optical methods that provide high diffraction image quality with a spatial resolution of several to tens of nanometers and are in demand in such areas as projection lithography, X-ray microscopy, astrophysics, and fundamental research on the interaction of matter (vacuum) with ultrahigh (1020 — 1023 W cm−2) electromagnetic fields are reviewed in terms of fabrication and testing technologies and possible use in the 2 — 60 nm wavelength range. The current worldwide status of and recent achievements by the Institute for Physics of Microstructures of the Russian Academy of Sciences (RAS) in the field are discussed.

Fulltext is available at IOP
PACS: 41.50.+h, 42.79.−e, 95.55.Ka (all)
DOI: 10.3367/UFNe.0182.201207c.0727
URL: https://ufn.ru/en/articles/2012/7/c/
Citation: Barysheva M M, Pestov A E, Salashchenko N N, Toropov M N, Chkhalo N I "Precision imaging multilayer optics for soft X-rays and extreme ultraviolet bands" Phys. Usp. 55 681–699 (2012)
BibTexBibNote ® (generic)BibNote ® (RIS)Medline RefWorks
RT Journal
T1 Precision imaging multilayer optics for soft X-rays and extreme ultraviolet bands
A1 Barysheva,M.M.
A1 Pestov,A.E.
A1 Salashchenko,N.N.
A1 Toropov,M.N.
A1 Chkhalo,N.I.
PB Physics-Uspekhi
PY 2012
FD 10 Jul, 2012
JF Physics-Uspekhi
JO Phys. Usp.
VO 55
IS 7
SP 681-699
DO 10.3367/UFNe.0182.201207c.0727
LK https://ufn.ru/en/articles/2012/7/c/

Received: 27th, June 2011, 17th, August 2011

Оригинал: Барышева М М, Пестов А Е, Салащенко Н Н, Торопов М Н, Чхало Н И «Прецизионная изображающая многослойная оптика для мягкого рентгеновского и экстремального ультрафиолетового диапазонов» УФН 182 727–747 (2012); DOI: 10.3367/UFNr.0182.201207c.0727

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