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Instruments and methods of investigation


Excilamps: efficient sources of spontaneous UV and VUV radiation

, , , , ,
Institute of High-Current Electronics, Siberian Branch of the Russian Academy of Sciences, Akademicheskii prosp. 4, Tomsk, 634055, Russian Federation

The results of research into high-power, high-efficiency noble-gas-halide excilamps using glow, capacitive, and barrier discharges for the excitation sources are presented. The maximum radiation powers and minimum consumption are achieved with glow discharge lamps. An excilamp with an average radiation power of 1.6 kW on KrCl* molecules (λ = 222 nm) and 1.1 kW on XeCl* molecules (λ = 308 nm) is developed, whose energy conversion efficiency exceeds 10%. The use of an electrodeless capacitive discharge leads to sealed off excilamps with a simple emitter design, which have a power of 1 to 10 W and a service life of about 2500 h and more. Barrier-discharge excilamps possess both high energy parameters (> 100 W m-1) and a long service life. Excilamps can find wide practical applications as new powerful sources of UV and VUV radiation.

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Fulltext is also available at DOI: 10.1070/PU2003v046n02ABEH001308
PACS: 07.60.−j, 42.72.Bj, 52.80.−s (all)
DOI: 10.1070/PU2003v046n02ABEH001308
URL: https://ufn.ru/en/articles/2003/2/d/
000183400800004
Citation: Lomaev M I, Skakun V S, Sosnin E A, Tarasenko V F, Shitts D V, Erofeev M V "Excilamps: efficient sources of spontaneous UV and VUV radiation" Phys. Usp. 46 193–209 (2003)
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Оригинал: Ломаев М И, Скакун В С, Соснин Э А, Тарасенко В Ф, Шитц Д В, Ерофеев М В «Эксилампы — эффективные источники спонтанного УФ- и ВУФ-излучения» УФН 173 201–217 (2003); DOI: 10.3367/UFNr.0173.200302d.0201

References (81) Cited by (200) ↓ Similar articles (12)

  1. Payne E M, McKeown R P et al Environ. Sci. Technol. 60 (5) 4418 (2026)
  2. Li Y, Wu F et al Journal Of Environmental Chemical Engineering 14 (2) 121702 (2026)
  3. Huang Y, Zhao M et al Journal Of Environmental Sciences 160 405 (2026)
  4. Nickerson T R, Sherritt J N et al ACS EST Eng. 6 (2) 920 (2026)
  5. Glazunov D S, Martynovich E F Sensors And Actuators A: Physical 395 117081 (2025)
  6. Sharma N K, Pal P et al Plasma Chem Plasma Process 45 (5) 1465 (2025)
  7. Baraze A, Muja C et al Plasma Med 15 (1) 33 (2025)
  8. Farkas L, Janáky C, Alapi T Journal Of Water Process Engineering 63 105514 (2024)
  9. Kulebyakina A I, Dubrovina V N et al Èkol. Prom. Ross. 28 (6) 18 (2024)
  10. Larouci B, Benmoussa A, Belasri A High Temp Mat Proc 28 (2) 45 (2024)
  11. Mostovshchikov A V, Tokarev D S et al J. Surf. Investig. 18 (6) 1477 (2024)
  12. Yao Q, Ji Q et al J. Phys. Chem. Lett. 15 (27) 7061 (2024)
  13. Mohaghegh M M, Raeiszadeh M, Taghipour F Journal Of Environmental Chemical Engineering 11 (3) 110040 (2023)
  14. Bidawat S, Sharma N K et al IEEE Trans. Plasma Sci. 51 (12) 3531 (2023)
  15. Shiyanov D V, Trigub M V et al XVI International Conference on Pulsed Lasers and Laser Applications, (2023) p. 53
  16. Baadj S, Larouci B et al Plasma Med 13 (4) 71 (2023)
  17. Bidawat S, Sharma N K et al 2023 IEEE Pulsed Power Conference (PPC), (2023) p. 1
  18. Benmoussa A, Bouchachia A et al Plasma Chem Plasma Process 43 (3) 657 (2023)
  19. Segal O, Shultzman A et al Applied Physics Letters 120 (23) (2022)
  20. Narita K, Asano K et al PLoS ONE 17 (5) e0267957 (2022)
  21. Garcia-Medina Ya D, Reyes-Alberto M et al Light-Emitting Devices, Materials, and Applications XXVI, (2022) p. 64
  22. Aznabaev R A, Pinchuk M E, Stepanova O M IEEE Trans. Plasma Sci. 49 (9) 2599 (2021)
  23. Avtaeva S Plasma Chem Plasma Process 41 (4) 1059 (2021)
  24. Schitz D V, Lomaev M I et al Opt. Eng. 60 (05) (2021)
  25. Schitz D, Ivankov A et al XV International Conference on Pulsed Lasers and Laser Applications, (2021) p. 56
  26. Chitete-Mawenda U, Serpone N, Horikoshi S Photochem Photobiol Sci 20 (1) 101 (2021)
  27. Buonanno M, Welch D, Brenner D J Photochem & Photobiology 97 (3) 517 (2021)
  28. Ivankov A S, Kozhevnikova A M et al Applied Sciences 11 (19) 9203 (2021)
  29. Schitz D V, Torshina I E et al Biomedical Photonics 9 (1) 21 (2020)
  30. Malinina A O, Shuaibov O K J. Phys. Stud. 24 (1) (2020)
  31. Pramanik P, Das S K, Halder M J. Phys. Chem. C 124 (8) 4791 (2020)
  32. Pandey S, Singh H et al J. Phys. Chem. B 124 (13) 2668 (2020)
  33. Avtaeva S V 2020 IEEE International Conference on Plasma Science (ICOPS), (2020) p. 221
  34. Avdeev S M, Burachenko A G et al Instrum Exp Tech 63 (4) 607 (2020)
  35. Diop M A, Belinger A, Piquet H Plasma 3 (3) 103 (2020)
  36. Akishev Y, Karalnik V et al J. Phys.: Conf. Ser. 1696 (1) 012022 (2020)
  37. Kalinichenko A, Sosnin E et al MSF 942 131 (2019)
  38. Feathers S, Stephens J, Neuber A IEEE Trans. Plasma Sci. 47 (1) 508 (2019)
  39. Malinina A A, Hrytsak R V Problems of Atomic Science and Technology 124 (2019)
  40. Lee Ja-I, Kim S-S, Kang D-H Sci Rep 9 (1) (2019)
  41. Wiesner A, Diez R et al Mathematics And Computers In Simulation 165 92 (2019)
  42. (PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON ADVANCES AND APPLICATIONS IN PLASMA PHYSICS (AAPP 2019)) Vol. PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON ADVANCES AND APPLICATIONS IN PLASMA PHYSICS (AAPP 2019)Electron energy relaxation length in xenon, chlorine and their mixtureA. P.Golovitskii2179 (2019) p. 020007
  43. Schitz D, Ivankov A, Pismennyi V J. Phys.: Conf. Ser. 1172 012052 (2019)
  44. Gubarev F A, Shiyanov D V, Sukhanov V B 2018 Progress in Electromagnetics Research Symposium (PIERS-Toyama), (2018) p. 1909
  45. van der Meer M, van Lierop F, Sokolov D V L&E 143 (2018)
  46. Heneral A A, Zhmenyak Y V J Appl Spectrosc 85 (1) 79 (2018)
  47. Rueda V, Wiesner A et al 2018 IEEE Industry Applications Society Annual Meeting (IAS), (2018) p. 1
  48. Dimitriev O P, Piryatinski Yu P, Slominskii Yu L J. Phys. Chem. Lett. 9 (9) 2138 (2018)
  49. Budovich V L, Dubakin A D et al Instrum Exp Tech 61 (1) 136 (2018)
  50. Yadav A, Pandey S J. Phys. Chem. B 121 (48) 10922 (2017)
  51. Budaev S L, Batoeva A A et al Russ. J. Phys. Chem. 91 (3) 604 (2017)
  52. Heneral A A, Avtaeva S V J. Phys. D: Appl. Phys. 50 (49) 495202 (2017)
  53. Benmoussa A, Belasri A, Harrache Z Current Applied Physics 17 (4) 479 (2017)
  54. Diop M A, Belinger A, Piquet H J. Phys.: Conf. Ser. 825 012004 (2017)
  55. Heneral A A, Avtaeva S V Opt. Spectrosc. 123 (4) 531 (2017)
  56. Avtaeva S V J. Phys.: Conf. Ser. 927 012006 (2017)
  57. JO HANJOO, JUNG MIN-JUNG et al Transactions Of The Korean Hydrogen And New Energy Society 27 (4) 421 (2016)
  58. Kim D Y, Kim J-H et al Applied Chemistry For Engineering 27 (5) 537 (2016)
  59. Datsyuk V V, Izmailov I A et al Plasma Sources Sci. Technol. 25 (4) 045020 (2016)
  60. Schitz D V, Nechoroshev V O J. Phys.: Conf. Ser. 673 012004 (2016)
  61. Miklin M B, Ghyngazov S A et al Journal Of Photochemistry And Photobiology A: Chemistry 315 94 (2016)
  62. Florez D, Diez R, Piquet H IEEE Trans. Plasma Sci. 44 (7) 1160 (2016)
  63. Schitz D V, Nekhoroshev V O, Savin V V Tech. Phys. 61 (2) 175 (2016)
  64. Malinina A A, Malinin A N Plasma Phys. Rep. 41 (3) 281 (2015)
  65. Jung M-Ju, Jung J-Y et al Journal Of Industrial And Engineering Chemistry 22 70 (2015)
  66. (International Conference on Atomic and Molecular Pulsed Lasers XII) Vol. International Conference on Atomic and Molecular Pulsed Lasers XIIPower distribution between electrons and ions in the dielectric barrier discharge in Xe-Cl2mixtures and radiation of Xe2*and XeCl*excimer moleculesVictor F.TarasenkoAndrey M.KabanovS. V.Avtaeva9810 (2015) p. 98101J
  67. Yadav A, Kurur N D, Pandey S J. Phys. Chem. B 119 (42) 13367 (2015)
  68. Sosnin E A, Avdeev S M et al Instrum Exp Tech 58 (3) 309 (2015)
  69. Jung M-Ju, Ko Y, Lee Y-S Applied Chemistry For Engineering 26 (2) 224 (2015)
  70. Datsyuk V V, Izmailov I A, Naumov V V Ukr. J. Phys. 60 (5) 416 (2015)
  71. Florez D, Diez R et al IEEE Trans. Ind. Electron. 62 (3) 1451 (2015)
  72. Kamrukov, Kamrukov A i dr Safety in Technosphere 4 (1) 68 (2015)
  73. Florez D, Diez R, Piquet H IEEE Trans. On Ind. Applicat. 50 (1) 86 (2014)
  74. Avtaeva S Eur. Phys. J. D 68 (4) (2014)
  75. Golovitskii A P Tech. Phys. 59 (11) 1599 (2014)
  76. Gulati P, Pal U N et al 2014 IEEE 41st International Conference on Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS), (2014) p. 1
  77. (Detection and Sensing of Mines, Explosive Objects, and Obscured Targets XIX) Vol. Detection and Sensing of Mines, Explosive Objects, and Obscured Targets XIXAn excimer-based FAIMS detector for detection of ultra-low concentration of explosivesSteven S.BishopJason C.IsaacsAlexander A.ChistyakovGennadii E.KotkovskiiAlexey V.SychevAnatoly N.PerederiyV. L.BudovichD. V.Budovich9072 (2014) p. 907211
  78. Gulati P, Prakash R et al Applied Physics Letters 105 (1) (2014)
  79. Boichenko A M, Klenovskii M S Tech. Phys. 58 (5) 744 (2013)
  80. General A A, Shpenik Yu O Ukr. J. Phys. 58 (2) 116 (2013)
  81. Florez D, Bonnin X et al 2013 Brazilian Power Electronics Conference, (2013) p. 1171
  82. Avtaeva S V, Sosnin E A et al Plasma Phys. Rep. 39 (9) 768 (2013)
  83. Leiweke R J, Ganguly B N Journal of Applied Physics 113 (14) (2013)
  84. Shuaibov A K, Minya A I et al Tech. Phys. 58 (3) 459 (2013)
  85. Gubarev F A, Shiyanov D V et al IEEE J. Quantum Electron. 49 (1) 89 (2013)
  86. Avdeev S M, Zvereva G N et al Opt. Spectrosc. 115 (1) 28 (2013)
  87. Lopez A M, Piquet H et al IEEE Trans. Plasma Sci. 41 (8) 2335 (2013)
  88. Malinina A A, Malinin A N Plasma Phys. Rep. 39 (12) 1035 (2013)
  89. Treshchalov A B, Lissovski A A, Ulrich A F Eur. Phys. J. D 67 (2) (2013)
  90. Gregório J, Aubert X et al Plasma Sources Sci. Technol. 23 (1) 015005 (2013)
  91. Orlov A M, Yavtushenko I O, Bodnarskii D S Tech. Phys. 58 (3) 363 (2013)
  92. Baadj S, Harrache Z, Belasri A Plasma Phys. Rep. 39 (12) 1043 (2013)
  93. Castano J A, Ruiz F Control Engineering Practice 21 (1) 96 (2013)
  94. Shuaibov A K, Gomoki Z T et al Opt. Spectrosc. 114 (2) 189 (2013)
  95. Orlov A M, Yavtushenko I O, Bodnarskii D S Tech. Phys. 57 (3) 386 (2012)
  96. Shuaibov A K, Gomoki Z T et al Tech. Phys. 57 (2) 311 (2012)
  97. Shuaibov A K, Minya A I et al J Appl Spectrosc 78 (6) 867 (2012)
  98. Orlov A M, Yavtushenko I O, Bodnarskii D S Tech. Phys. Lett. 38 (1) 29 (2012)
  99. Tarasenko V F, Sosnin E A J. Opt. Technol. 79 (10) 653 (2012)
  100. Lomaev M I, Sosnin E A, Tarasenko V F Progress In Quantum Electronics 36 (1) 51 (2012)
  101. Tarasenko V F, Sosnin E A et al Plasma for Bio-Decontamination, Medicine and Food Security NATO Science For Peace And Security Series A: Chemistry And Biology Chapter 19 (2012) p. 251
  102. Florez D, Diez R, Piquet H 2012 IEEE Industry Applications Society Annual Meeting, (2012) p. 1
  103. Kogelschatz U J. Opt. Technol. 79 (8) 484 (2012)
  104. Gnybida M, Uhrlandt D, Loffhagen D J. Phys. D: Appl. Phys. 45 (19) 195203 (2012)
  105. Pikulev A A, Tsvetkov V M et al Instrum Exp Tech 55 (5) 513 (2012)
  106. Florez D, Diez R et al 2012 13th International Conference on Optimization of Electrical and Electronic Equipment (OPTIM), (2012) p. 1346
  107. Shuaibov A K, Minya A I et al Tech. Phys. 56 (3) 356 (2011)
  108. Orlov A M, Yavtushenko I O, Bodnarskii D S Tech. Phys. Lett. 37 (6) 556 (2011)
  109. Erofeev V I, Medvedev A S et al Russ J Appl Chem 84 (10) 1760 (2011)
  110. Kelman V A, Shpenik Yu O, Zhmenyak Yu V J. Phys. D: Appl. Phys. 44 (25) 255202 (2011)
  111. Shuaibov A K, Gomoki Z T et al Tech. Phys. 56 (8) 1213 (2011)
  112. Shuaibov A K, Malinina A A High Temp 49 (4) 487 (2011)
  113. Pipa A V, Bussiahn R Contrib. Plasma Phys. 51 (9) 850 (2011)
  114. TARASENKO Victor, EROFEEV Mikhail et al J. Light & Vis. Env. 35 (3) 227 (2011)
  115. Shuaibov A K, Grabovaya I A et al Plasma Phys. Rep. 37 (3) 244 (2011)
  116. Avtaeva S V, Saghi B, Rahmani B IEEE Trans. Plasma Sci. 39 (9) 1814 (2011)
  117. Shuaibov A K, Gomoki Z T et al Opt. Spectrosc. 109 (5) 669 (2010)
  118. Lomaev M I, Lisenko A A, Tarasenko V F Opt. Spectrosc. 108 (6) 923 (2010)
  119. Avtaeva S V, Skornyakov A V Russ Phys J 53 (3) 257 (2010)
  120. Lipatov E I, Avdeev S M, Tarasenko V F Journal Of Luminescence 130 (11) 2106 (2010)
  121. Bussiahn R, Pipa A V, Kindel E Contrib. Plasma Phys. 50 (2) 182 (2010)
  122. Erofeev M V, Schitz D V et al Phys. Scr. 82 (4) 045403 (2010)
  123. Klenovskii M S, Kel’man V A et al Tech. Phys. 55 (5) 709 (2010)
  124. Pikulev A A, Tsvetkov V M Tech. Phys. 55 (1) 44 (2010)
  125. Shuaibov A K, Minya A I et al Tech. Phys. 55 (8) 1222 (2010)
  126. Krekov G M, Krekova M M et al Russ Phys J 53 (7) 667 (2010)
  127. Guivan M M, Guyvan A M Plasma Sources Sci. Technol. 19 (5) 055014 (2010)
  128. Erofeev M V, Baksht E Kh et al Quantum Electron. 40 (6) 561 (2010)
  129. Shuaibov A K, Heneral A A et al Tech. Phys. 54 (8) 1238 (2009)
  130. Krekov G M, Lisenko A A et al Atmos Ocean Opt 22 (5) 556 (2009)
  131. Tarasenko V F, Baksht E Kh et al 2009 IEEE Pulsed Power Conference, (2009) p. 1422
  132. Shuaibov A K, Grabovaya I A et al Tech. Phys. 54 (12) 1819 (2009)
  133. Shuaibov A K, Malinin A N Opt. Spectrosc. 106 (4) 499 (2009)
  134. Avtaeva S V, Skornyakov A V Plasma Phys. Rep. 35 (7) 593 (2009)
  135. Avtaeva S V, Kulumbaev E B Plasma Phys. Rep. 35 (4) 329 (2009)
  136. Volkova G A, Zvereva G N Opt. Spectrosc. 106 (5) 642 (2009)
  137. Gubarev F A, Sukhanov V B et al IEEE J. Quantum Electron. 45 (2) 171 (2009)
  138. Shuaibov A K, Minya A I et al Tech. Phys. 54 (1) 146 (2009)
  139. Krekov G M, Krekova M M et al Opt. Spectrosc. 107 (5) 696 (2009)
  140. Tarasenko V, Avdeev S et al Acta Phys. Pol. A 116 (4) 576 (2009)
  141. Krekov G M, Lisenko A A et al Tech. Phys. Lett. 35 (11) 973 (2009)
  142. Rahmani B, Bhosle S, Zissis G IEEE Trans. Plasma Sci. 37 (4) 546 (2009)
  143. Tarasenko V F, Yakovlenko S I et al Phys. Wave Phen. 16 (3) 180 (2008)
  144. Lomaev M I, Skakun V S et al Tech. Phys. 53 (2) 244 (2008)
  145. Shuaibov A K, Shimon L L et al J Appl Spectrosc 75 (1) 125 (2008)
  146. Shits D V, Skakun V S, Tarasenko V F Instrum Exp Tech 51 (5) (2008)
  147. Shuaibov A K, Malinina A A J Appl Spectrosc 75 (4) 583 (2008)
  148. Bryantseva N G, Fedorova E S et al J Appl Spectrosc 75 (2) (2008)
  149. Pikulev A A, Tsvetkov V M Tech. Phys. 53 (10) 1332 (2008)
  150. Boichenko A M, Lomaev M I, Tarasenko V F Laser Phys. 18 (6) 738 (2008)
  151. Shuaibov A K, Minya A J et al Tech. Phys. Lett. 34 (9) 765 (2008)
  152. Shuaibov A K, Shimon L L et al Tech. Phys. Lett. 34 (1) 14 (2008)
  153. Shuaibov A K, Shevera I V Opt. Spectrosc. 104 (4) 534 (2008)
  154. Schitz D V, Erofeev M V et al Instrum Exp Tech 51 (6) 886 (2008)
  155. Lisenko A A, Lomaev M I et al Phys. Scr. 76 (3) 211 (2007)
  156. Guivan M M, Malinin A N Opt. Spectrosc. 102 (3) 376 (2007)
  157. Kogelschatz U Plasma Processes & Polymers 4 (7-8) 678 (2007)
  158. Shuaibov A K, Shevera I V Tech. Phys. 52 (9) 1195 (2007)
  159. Avdeev S M, Boichenko A M et al Laser Phys. 17 (9) 1119 (2007)
  160. Shuaibov A K, Grabovaya I A J Appl Spectrosc 74 (6) 910 (2007)
  161. Avdeev S M, Zvereva G N, Sosnin É A Opt. Spectrosc. 103 (6) 910 (2007)
  162. Shuaibov A K, Grabovaya I A Tech. Phys. Lett. 33 (5) 447 (2007)
  163. Lomaev M I, Tarasenko V F, Schitz D V Tech. Phys. 52 (8) 1046 (2007)
  164. Boichenko A M, Erofeev M V et al Laser Phys. 17 (6) 798 (2007)
  165. Shuaibov A K, Grabovaya I A Opt. Spectrosc. 101 (3) 384 (2006)
  166. Lomaev M I, Skakun V S et al Tech. Phys. Lett. 32 (6) 495 (2006)
  167. Alekseev S B, Kuvshinov V A et al Instrum Exp Tech 49 (1) 132 (2006)
  168. Shuaibov A K, Grabovaya I A Tech. Phys. Lett. 32 (12) 1036 (2006)
  169. Yakovlenko S I Laser Phys. 16 (3) 403 (2006)
  170. Shuaibov A K, Grabovaya I A, Shimon L L Instrum Exp Tech 49 (1) 106 (2006)
  171. Erofeev M V, Tarasenko V F J. Phys. D: Appl. Phys. 39 (16) 3609 (2006)
  172. Bogdanov E A, Kudryavtsev A A, Arslanbekov R R Contrib. Plasma Phys. 46 (10) 807 (2006)
  173. Guivan N N, Malinin A N High Temp 44 (3) 356 (2006)
  174. Guivan M M, Malinin A N et al Czech J Phys 56 (S2) B659 (2006)
  175. Sosnin E A, Oppenländer T, Tarasenko V F Journal Of Photochemistry And Photobiology C: Photochemistry Reviews 7 (4) 145 (2006)
  176. Lomaev M I, Sosnin E A et al Instrum Exp Tech 49 (5) 595 (2006)
  177. Shuaibov A K, Grabovaya I A Instrum Exp Tech 49 (3) 413 (2006)
  178. Lomaev M I, Skakun V S et al Tech. Phys. Lett. 32 (7) 590 (2006)
  179. Sosnin E A, Zakharova E A et al Instrum Exp Tech 49 (1) 101 (2006)
  180. Avdeev S M, Kostyrya I D et al Tech. Phys. 51 (7) 878 (2006)
  181. Baksht E Kh, Lomaev M I et al Tech. Phys. Lett. 32 (10) 847 (2006)
  182. Shuaibov A K, Shevera I V, General A A J Appl Spectrosc 73 (6) 932 (2006)
  183. Panchenko A N, Tarasenko V F et al Phys. Scr. 74 (1) 108 (2006)
  184. Shuaibov A K Opt. Spectrosc. 98 (4) 510 (2005)
  185. Guivan N N, Janča J et al J. Phys. D: Appl. Phys. 38 (17) 3188 (2005)
  186. Tarasenko V F, Yakovlenko S I Phys. Scr. 72 (1) 41 (2005)
  187. Sosnin E A, Zakharova E A et al Proceedings. 2005 International Conference Physics and Control, 2005., (2005) p. 786
  188. Shuaibov A K Tech. Phys. Lett. 31 (10) 894 (2005)
  189. Shuaibov A K Tech. Phys. Lett. 31 (2) 103 (2005)
  190. Shuaibov A K, Grabovaya I A J Appl Spectrosc 72 (6) 921 (2005)
  191. Shuaibov A K, Grabovaya I A J Appl Spectrosc 72 (2) 262 (2005)
  192. Bogdanov E A, Kudryavtsev A A et al J. Phys. D: Appl. Phys. 37 (21) 2987 (2004)
  193. Shuaibov A K, Grabovaya I A Tech. Phys. 49 (4) 443 (2004)
  194. Lisenko A A, Lomaev M I, Tarasenko V F Russ Phys J 47 (12) 1312 (2004)
  195. Shuaibov A K, Dashchenko A I, Shevera I V Opt. Spectrosc. 97 (1) 6 (2004)
  196. Sosnin É A, Lavrent’eva L V et al Tech. Phys. Lett. 30 (7) 615 (2004)
  197. Shuaibov A K, Dashchenko A I, Shevera I V Tech. Phys. 49 (5) 647 (2004)
  198. Lomaev M I, Tarasenko V F et al Tech. Phys. 49 (6) 790 (2004)
  199. Tarasenko V F, Shitts D V, Lomaev M I Russian Physics Journal 46 (7) 745 (2003)
  200. Shuaibov A K, Dashchenko A I et al Tech. Phys. Lett. 29 (12) 1009 (2003)
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