Issues

 / 

1986

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June

  

New instruments and measurement methods


EXAFS spectroscopy: a new method for structural investigation

EXAFS spectroscopy is a new method of investigating materials which allows one to determine structural parameters of the local environment of atoms with some specified $\mathbf{Z}$ by studying their x-ray spectra. Among these parameters are the interatomic spacings, coordination numbers and amplitudes of thermal oscillations. It is not necessary for long-range order to be present in the sample under investigation. Depending on the way this technique for obtaining the spectrum is applied, one can analyze the local environment of atoms located either within the sample volume or at its surface. We investigate the physical phenomena on which the method is based, the mathematical techniques used to process the experimental data, and various methods of recording the spectra. We present a series of examples in which EXAFS spectroscopy is used to study superionic conductors, compounds with intermediate valence, biological molecules, solid solutions, catalysts, surface layers and intercalated compounds.

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Fulltext is also available at DOI: 10.1070/PU1986v029n06ABEH003418
PACS: 78.70.Dm, 61.10.Ht (all)
DOI: 10.1070/PU1986v029n06ABEH003418
URL: https://ufn.ru/en/articles/1986/6/d/
Citation: Borovskii I B, Vedrinskii R V, Kraizman V L, Sachenko V P "EXAFS spectroscopy: a new method for structural investigation" Sov. Phys. Usp. 29 539–569 (1986)
BibTexBibNote ® (generic)BibNote ® (RIS) MedlineRefWorks
PT Journal Article
TI EXAFS spectroscopy: a new method for structural investigation
AU Borovskii I B
FAU Borovskii IB
AU Vedrinskii R V
FAU Vedrinskii RV
AU Kraizman V L
FAU Kraizman VL
AU Sachenko V P
FAU Sachenko VP
DP 10 Jun, 1986
TA Phys. Usp.
VI 29
IP 6
PG 539-569
RX 10.1070/PU1986v029n06ABEH003418
URL https://ufn.ru/en/articles/1986/6/d/
SO Phys. Usp. 1986 Jun 10;29(6):539-569

Оригинал: Боровский И Б, Ведринский Р В, Крайзман В Л, Саченко В П «EXAFS-спектроскопия — новый метод структурных исследований» УФН 149 275–324 (1986); DOI: 10.3367/UFNr.0149.198606d.0275

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