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Secondary-Emission Methods of Investigating the Structure and Composition of the Surface Layers of Solids

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Fulltext is also available at DOI: 10.1070/PU1977v020n07ABEH005451
PACS: 01.10.Fv
DOI: 10.1070/PU1977v020n07ABEH005451
URL: https://ufn.ru/en/articles/1977/7/h/
Citation: Abroyan I A, Korablev V V, Petrov N N, Titov A I "Secondary-Emission Methods of Investigating the Structure and Composition of the Surface Layers of Solids" Sov. Phys. Usp. 20 640–642 (1977)
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T1 Secondary-Emission Methods of Investigating the Structure and Composition of the Surface Layers of Solids
A1 Abroyan,I.A.
A1 Korablev,V.V.
A1 Petrov,N.N.
A1 Titov,A.I.
PB Physics-Uspekhi
PY 1977
FD 10 Jul, 1977
JF Physics-Uspekhi
JO Phys. Usp.
VO 20
IS 7
SP 640-642
DO 10.1070/PU1977v020n07ABEH005451
LK https://ufn.ru/en/articles/1977/7/h/

Оригинал: Аброян И А, Кораблев В В, Петров Н Н, Титов А И «Вторично-эмиссионные методы исследования структуры и состава приповерхностных слоев твердых тел» УФН 122 528–529 (1977); DOI: 10.3367/UFNr.0122.197707i.0528

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