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Secondary-Emission Methods of Investigating the Structure and Composition of the Surface Layers of Solids

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Fulltext is also available at DOI: 10.1070/PU1977v020n07ABEH005451
PACS: 01.10.Fv
DOI: 10.1070/PU1977v020n07ABEH005451
URL: https://ufn.ru/en/articles/1977/7/h/
Citation: Abroyan I A, Korablev V V, Petrov N N, Titov A I "Secondary-Emission Methods of Investigating the Structure and Composition of the Surface Layers of Solids" Sov. Phys. Usp. 20 640–642 (1977)
BibTexBibNote ® (generic) BibNote ® (RIS)MedlineRefWorks
TY JOUR
TI Secondary-Emission Methods of Investigating the Structure and Composition of the Surface Layers of Solids
AU Abroyan, I. A.
AU Korablev, V. V.
AU Petrov, N. N.
AU Titov, A. I.
PB Physics-Uspekhi
PY 1977
JO Physics-Uspekhi
JF Physics-Uspekhi
JA Phys. Usp.
VL 20
IS 7
SP 640-642
UR https://ufn.ru/en/articles/1977/7/h/
ER https://doi.org/10.1070/PU1977v020n07ABEH005451

Оригинал: Аброян И А, Кораблев В В, Петров Н Н, Титов А И «Вторично-эмиссионные методы исследования структуры и состава приповерхностных слоев твердых тел» УФН 122 528–529 (1977); DOI: 10.3367/UFNr.0122.197707i.0528

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