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Issue 4, 2024
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PACS numbers

61.72.Ff Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.)
  1. T.S. Argunova, V.G. Kohn “Study of micropores in single crystals by in-line phase contrast imaging with synchrotron radiation” 62 602–616 (2019)
    42.25.Fx, 42.25.Kb, 61.72.−y, 61.72.Ff, 61.72.Lk (all)
  2. V.I. Karas’, V.I. Sokolenko “Nonequilibrium kinetics of the electron—phonon subsystem can give rise to electric- and magnetic-plasticity effects in crystals in alternating electric and/or magnetic fields” 61 1051–1071 (2018)
    61.72.Ff, 61.72.Hh, 62.20.Hg, 63.20.kd, 63.20.kp, 75.80.+q, 83.60.Np (all)
  3. E.V. Suvorov, I.A. Smirnova “X-ray diffraction imaging of defects in topography (microscopy) studies” 58 833–849 (2015)
    61.05.C−, 61.72.Dd, 61.72.Ff (all)
  4. A.A. Chernov “Elementary processes of crystal growth from solutions” 30 1098–1100 (1987)
    81.10.Dn, 61.72.Ff, 77.84.Fa, 68.35.Fx (all)
  5. G.V. Spivak, G.V. Saparin, M.V. Bykov “Scanning electron microscopy” 12 756–776 (1970)
    07.78.+s, 68.37.Hk, 78.60.Hk, 61.72.Ff, 87.64.Ee (all)
  6. L.G. Orlov, M.P. Usikov, L.M. Utevskii “Electron-microscope observation of dislocations in metals” 5 53–78 (1962)
    61.72.Ff, 61.72.Ji, 61.72.Nn (all)
  7. E.Yu. Kokorish, N.N. Sheftal’ “Dislocations in semiconductor crystals” 3 840–849 (1961)
    61.72.Bb, 61.72.Ff, 62.20.Fe, 71.20.Mq, 72.20.Jv, 61.72.Ss (all)
  8. D.M. Vasil’ev, B.I. Smirnov “Certain X-RAY diffraction methods of investigating cold worked metals” 4 226–259 (1961)
    61.10.Nz, 62.20.Fe, 61.72.Nn, 61.66.Bi, 61.72.Ff (all)
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