Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams

A.A. Bukharaev
E.K. Zavoiskii Kazan Physicotechnical Institute, Kazan Scientific Centre of the Russian Academy of Sciences, Sibirskii trakt 10/7, Kazan, 420029, Russian Federation

PACS: 07.79.Cz, 07.79.Lh, 42.62.Hk (all)
DOI: 10.1070/PU1996v039n02ABEH001499
URL: https://ufn.ru/en/articles/1996/2/h/
Web of Science

A1996UB80800009
Citation: Bukharaev A A "Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams" Phys. Usp. 39 193–196 (1996)

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RT Journal
T1 Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams

A1 Bukharaev,A.A.
PB Physics-Uspekhi
PY 1996
FD 10 Feb, 1996
JF Physics-Uspekhi
JO Phys. Usp.
VO 39
IS 2
SP 193-196
DO 10.1070/PU1996v039n02ABEH001499
LK https://ufn.ru/en/articles/1996/2/h/

Оригинал: Бухараев А А «Исследование с помощью сканирующей туннельной и атомно-силовой микроскопии поверхностей, модифицированных ионными и лазерными пучками» УФН 166 210–213 (1996); DOI: 10.3367/UFNr.0166.199602i.0210